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Abnormal idle storage analysis method, device and system

An analysis method and abnormal technology, applied in instruments, electrical digital data processing, input/output to record carriers, etc., can solve the problems of high labor cost, low analysis efficiency, and inability to easily modify the storage configuration, so as to reduce labor costs, Improve analysis efficiency and realize the effect of intelligent automatic analysis

Active Publication Date: 2019-02-19
CHINA CONSTRUCTION BANK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing manual analysis method has low analysis efficiency and high labor cost, and the solution to the problem depends entirely on the experience of the technician, which causes potential uncontrollable factors
In addition, frequent manual allocation and recycling operations will inevitably lead to omissions, which will cause many "historical" problems in storage. In addition, storage has a large impact and cannot easily modify storage configuration. It is difficult to delete and modify errors and redundant configurations, which increases the difficulty and burden of follow-up workers to solve problems

Method used

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  • Abnormal idle storage analysis method, device and system
  • Abnormal idle storage analysis method, device and system
  • Abnormal idle storage analysis method, device and system

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Embodiment Construction

[0037] In order to facilitate the understanding of various aspects, features and advantages of the technical solutions of the present invention, the present invention will be specifically described below in conjunction with the accompanying drawings. It should be understood that the various embodiments described below are only for illustration, rather than limiting the protection scope of the present invention.

[0038] image 3 It is a flowchart of an analysis method for abnormal free storage according to an embodiment of the present invention, refer to image 3 , the abnormal free storage analysis method described in the embodiment of the present invention includes:

[0039] S101: Receive an analysis request for a storage device, and obtain storage information in a standard format according to the analysis request;

[0040]S102: According to the storage information in the standard format, abnormal free storage is found, and according to the found storage information of abn...

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Abstract

The invention discloses an abnormal idle storage analysis method, a device and a system, which relate to the computer storage field. The abnormal idle storage analysis method of the invention constructs different Bloom Filters according to the storage information of the abnormal idle storage, Use the Bloom filter to record stored information that has been found to be unusually idle, At the same time, using Bloom filter to check the repeated abnormal idle storage information, according to the abnormal idle storage information to prompt the problems of the environment, the intelligent automaticanalysis of the storage environment problems is realized, the human cost of manual analysis and inspection is reduced, and the analysis efficiency is improved.

Description

technical field [0001] The invention relates to the field of computer storage, and more specifically, to an analysis method, device and system for abnormal idle storage of storage devices. Background technique [0002] Abnormal free storage resources (AFSR, abnormal free storage resources) refer to the released storage resources that cannot be directly identified by the storage end. One of the most common reasons for this phenomenon is that the resource occupant (minicomputer or database, etc.) Some abnormal reasons (such as forced recycling, power off without recycling, etc.) are lost. Abnormal free storage (AFSR) can be considered as an error and redundant configuration. The storage side maps the space to one or several servers through the network, but due to line loss, server shutdown, server recovery, HBA (Host Bus Adapter, Host bus adapter) damage and other reasons caused the space on the storage side not to be reclaimed in time. [0003] figure 1 It is a schematic d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/06
CPCG06F3/0604G06F3/0653G06F3/067
Inventor 王然涂耀旭戴勇强徐庆智刘洋刘海博仵中翰李珊珊余晓峰
Owner CHINA CONSTRUCTION BANK
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