Z scanning device adapted to ultra-short pulse ultra-continuous white light source

Abstract

The invention discloses a Z scanning device adapted to an ultra-short pulse ultra-continuous white light source, which solves the technical problems that continuous non-linear spectral lines within alarge wavelength range are measured at one time by adopting ultra-continuous white light as a light source and using a spectrometer as a detector, the continuous white light is generally realized by afemtosecond laser pumping liquid or solid-state nonlinear medium at present, the generated continuous white light is usually low in power and stability to result in poor signal-to-noise ratio of measured signals and can only be used for testing materials with a high non-linear effect, the measurement effect is not ideal for some materials with a low nonlinear effect, such as a liquid with low concentration and a film with thin thickness, and that most continuous white-light Z scanning devices adopted at present adopt a lens focusing mode, and the mode is only suitable for multiple scanning ofsingle-wavelength and narrow-band continuous white light in consideration of influences imposed on the femtosecond laser pulse width by a lens.

Description

technical field [0001] The invention relates to the field of Z-scanning, in particular to a Z-scanning device adapted to an ultrashort pulse supercontinuous white light source. Background technique [0002] Z-scan technology is the most commonly used method to measure nonlinear optical effects, especially the third-order nonlinear optical effects, which can effectively measure nonlinear refraction and absorption properties of materials. The femtosecond pulsed laser has short duration and high peak power, which provides good excitation light source conditions for measuring nonlinear optical effects of materials. [0003] The existing femtosecond laser-based Z-scanning equipment usually uses a commercial laser with a pulse width of tens or hundreds of femtoseconds (fs), or further uses it in combination with an optical parametric amplifier (OPA) to obtain laser pulses with tunable wavelengths as light source. Since the spectral width of this light source is usually only tens...

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Problems solved by technology

[0005] The invention provides a Z-scanning device adapted to ultrashort pulse supercontinuous white light source, which is used to solve the existing problem of using supercontinuous white light as the light source and spectrometer as the detector to measure the continuous However, since the current continuous white light is mostly realized by pumping liquid or solid nonlinear media with femtosecond lasers, the power and stability of the generated continuous white light are usually low, resulting in the signal-to-noise ratio of the measured signal Poor, can only be used to test materials with high nonlinear effects

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