A High Precision Stress Sensing System Based on Michelson Interference Structure

A technology of stress sensing and interference structure, which is applied in the direction of force measurement, measurement force, instrument, etc. by measuring the change of optical properties of materials when they are stressed. and other problems, to achieve the effect of wide application occasions, small phase detection error, and improved sensing accuracy

Inactive Publication Date: 2020-02-18
JILIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, on the one hand, the high-frequency component itself will affect the phase detection of the cosine wave (the position of the zero-crossing point changes); The electrical characteristics are equivalent to capacitance, and the voltage at both ends cannot jump, so the falling edge of the sawtooth wave cannot be infinitely short) and the elasticity of the optical fiber itself and many other factors, the frequency is variable, and it is difficult to filter out cleanly; and , when using a filter, in addition to affecting the amplitude-frequency characteristics of the output signal, it will also affect the phase-frequency characteristics of the signal at the same time, that is, the phase of the filter will be affected near the cut-off frequency, which is very important for relying on phase changes. It is very disadvantageous for fiber optic sensors that measure changes in stress

Method used

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  • A High Precision Stress Sensing System Based on Michelson Interference Structure
  • A High Precision Stress Sensing System Based on Michelson Interference Structure
  • A High Precision Stress Sensing System Based on Michelson Interference Structure

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Experimental program
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Embodiment 1

[0026] Embodiment 1 Overall structure of the present invention

[0027] Such as figure 1 As shown, the overall structure of the present invention has, the pump source 1 (980nm laser, maximum output power is 1W) is connected with the 980nm end of the optical wavelength division multiplexer 2 (980 / 1550nm wavelength division multiplexer), and the optical wavelength division multiplexer The 1550nm end of the device 2 is connected to one end of the delay line adjustable optical fiber 11 (VDL-40-15-S9-1-FA type electric optical fiber delay line of Sichuan Yuxingguang Technology Co., Ltd.), and the other end of the delay line adjustable optical fiber 11 One end is connected to the input end of the first optical isolator 10 (1550nm polarization-independent optical isolator), the control end of the delay line adjustable optical fiber 11 is connected to the output port of the level shifting chip 12, and the input end of the level shifting chip 12 is connected to the output port of the ...

Embodiment 2

[0029] Embodiment 2 function conversion circuit

[0030] The structure of the function transformation circuit 26 is that one end of the capacitor C3 is connected to the pin 12 of the trigonometric function converter U1 and one end of the resistor R2, and the other end of the capacitor C3 is used as the input end of the function transformation circuit 26, which is recorded as the port ACOS_in , connected to the output end of the photoelectric conversion circuit 25; the other end of the resistor R2 is grounded; the pins 2, 3, 4, 5, 8, 11, 13 of the trigonometric function converter U1 are grounded, and the pins 9, 10 are connected to the capacitor C2 One end is connected to -12V power supply, the other end of capacitor C2 is grounded; pin 6 of trigonometric function converter U1 is connected to pin 7, pin 16 is connected to +12V power supply and one end of capacitor C1, and the other end of capacitor C1 is grounded; The pin 1 of the trigonometric function converter U1 is connecte...

Embodiment 3

[0031] Embodiment 3 Adaptive Amplitude Normalization Circuit

[0032] Because the signal amplitude of the function conversion circuit 26 output is relatively small, and is affected by multiple parameters in the optical path and the circuit, the size is indefinite, so the present invention has designed an adaptive amplitude normalization circuit 27, which is used for the signal output by the function conversion circuit 26 The amplitude is normalized to the optimal size to further improve the accuracy of demodulation. The structure of the adaptive amplitude normalization circuit 27 is that one end of the capacitor C9 is connected to one end of the resistor R3 and the pin 3 of the chip U2, the other end of the resistor R3 is grounded, and the other end of the capacitor C9 is used as an adaptive amplitude normalization The input terminal of the circuit 27 is recorded as the port ADAPT_in, and is connected with the port ACOS_out of the function conversion circuit 26; the pin 1, the...

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PUM

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Abstract

The invention discloses a high-precision stress sensing system based on Michelson interference structure and belongs to the technical field of optical fiber sensors. The main structure of the high-precision stress sensing system comprises a pumping source (1), an optical wavelength division multiplexer (3), an erbium-doped optical fiber (3) and the like. The high-precision stress sensing system uses a sinusoidal signal as a modulation signal, does not generate high-frequency interference, and is reliable in operation, high in sensing precision and wide in application range.

Description

technical field [0001] The invention belongs to the technical field of optical fiber sensors, in particular to a high-precision stress sensing system based on a Michelson interference structure. Background technique [0002] Fiber Bragg grating (FBG) is widely used in the field of sensing technology due to its advantages of anti-electromagnetic interference, chemical resistance, small transmission loss, small size and light weight, and easy mass production. At present, stress sensors are widely used in the field of engineering technology. Especially in emerging fields such as nanoparticle interaction and cell mechanics, there is an urgent need for micro-stress sensors, and the safety monitoring of bridges, tunnels, and building structures is inseparable from micro-stress sensors. Due to the above-mentioned advantages of the fiber Bragg grating, the stress sensor formed by it has higher reliability than other sensors, and is more suitable for use under harsh conditions. [...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01L1/24
CPCG01L1/246
Inventor 高博林旻邱天张栋
Owner JILIN UNIV
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