Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring doppler frequency shift based on dual parallel Mach-Zehnder modulator

A Doppler frequency shift and modulator technology, which is applied in the field of microwave signal Doppler frequency shift measurement, can solve the problems of increasing system complexity and sources of error factors, system complexity, and many error sources

Active Publication Date: 2017-06-09
XIDIAN UNIV
View PDF2 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to measure the positive and negative of DFS, a frequency reference module is generally added, but at the same time, the complexity of the system and the source of error factors are increased; the method of combining quadrature frequency mixing and balanced detection can also be used to compare the quadrature two signals Phase difference to determine positive and negative
The second way of thinking is accurate in measurement, but the current reported method uses more modulators and discrete devices, the system is too complex, and there are many sources of error, which needs further improvement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring doppler frequency shift based on dual parallel Mach-Zehnder modulator
  • Device and method for measuring doppler frequency shift based on dual parallel Mach-Zehnder modulator
  • Device and method for measuring doppler frequency shift based on dual parallel Mach-Zehnder modulator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] Below in conjunction with accompanying drawing the embodiment of the present invention is described in detail: present embodiment is carried out under the premise of technical solution of the present invention, has provided detailed implementation mode and concrete operation process, but protection scope of the present invention is not limited to subordinates Example of:

[0036] Such as figure 1 As shown, in this embodiment, the device includes: LD, DPMZM modulator, echo signal source, transmission signal source, EDFA, DWDM, PD, oscilloscope, and electric spectrometer. The LD is connected to the DPMZM and the EDFA in turn, and the radio frequency echo signal and the sending signal are respectively loaded on the upper and lower arms of the DPMZM. EDFA is followed by DWDM, and the output terminals of DWDM are respectively PD1 and PD2, and the Doppler signal after down-conversion is obtained at the output terminal of PD. Among them, the DPMZM modulator is integrated by ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device and a method for measuring the doppler frequency shift based on a dual parallel Mach-Zehnder modulator, and relates to the technical field of the microwave technology and the optical communication technology. The device is shown in the figure and includes a laser diode (LD), a dual parallel Mach-Zehnder modulator (DPMZM), an erbium doped fiber amplifier (EDFA), a dense wavelength division multiplexing (DWDM) and a photodetector (LD). According to the technical scheme of the invention, echo signals and sending signals are subjected to carrier-suppressed double sideband modulation by the dual parallel Mach-Zehnder modulator (DPMZM). Meanwhile, the powers of upper and lower sidebands, and the phase difference between upper and lower sidebands are fully utilized for the measurement of the magnitude and the positive / negative attribute of the doppler frequency shift. Therefore, the measurement error is small. The range of the carrier frequency can be freely regulated within a large range, while the deterioration of the measurement error is avoided. In addition, the device has fewer parts, and is simple in structure and easy in operation. The device and the method have a good application prospect in the fields of radar, reconnaissance systems and the like.

Description

technical field [0001] The invention relates to the technical field of optical communication and microwave technology, and mainly relates to the realization of Doppler frequency shift measurement of microwave signals based on dual parallel Mach-Zehnder modulators. Background technique [0002] The Doppler frequency shift (DFS) phenomenon caused by the Doppler effect is widely used in mobile communication, microwave / millimeter wave measurement, electronic warfare and radar systems. Therefore, it is of great significance to accurately measure the Doppler frequency shift. Traditional electronic measurement methods are generally based on coherent oscillators and narrow-band mixers. Fourier analysis, time-frequency analysis, quadrature mixing and other methods are used to measure DFS, and the measurement devices work in a narrow specific frequency band. As the frequency of radio signals continues to increase, people have higher and higher requirements for the multifunctional int...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R23/02
CPCG01R23/02
Inventor 陈玮文爱军李晓艳
Owner XIDIAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products