Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Superconducting nanowire single photo detector for suppressing polarization sensitivity

A single-photon detector, superconducting nanowire technology, applied in the field of light detection, can solve the problems of high polarization sensitivity, low absorption efficiency, influence of absorption efficiency, etc., to avoid the influence of absorption efficiency, high absorption efficiency, and avoidance of far The effect of distance focus

Active Publication Date: 2017-03-29
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF6 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a superconducting nanowire single photon detector that suppresses polarization sensitivity, which is used to solve the problem of low absorption efficiency of the superconducting nanowire single photon detector in the prior art , high polarization sensitivity, and the influence of the substrate Fabry-Perot cavity on the absorption efficiency, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Superconducting nanowire single photo detector for suppressing polarization sensitivity
  • Superconducting nanowire single photo detector for suppressing polarization sensitivity
  • Superconducting nanowire single photo detector for suppressing polarization sensitivity

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] Such as image 3 As shown, the present embodiment provides a superconducting nanowire single photon detector that suppresses polarization sensitivity, including:

[0049] substrate 20;

[0050] A high reflection film 21 located on the surface of the substrate 20;

[0051] Superconducting nanowires 22, located on the surface of the high reflection film 21;

[0052] The dielectric layer 23 is located on the surface of the high reflection film 21 and covers the superconducting nanowires 22, and is suitable for reducing the polarization sensitivity of the superconducting nanowires 22 to light absorption.

[0053] As an example, the superconducting nanowire single photon detector with suppressed polarization sensitivity in this embodiment is a superconducting nanowire single photon detector with a front incident structure.

[0054] As an example, the substrate 20 includes a silicon substrate, an MgO substrate or a sapphire substrate, and the thickness of the substrate 20 is...

Embodiment 2

[0063] Such as Figure 4 As shown, this embodiment also provides a superconducting nanowire single-photon detector that suppresses polarization sensitivity. In this embodiment, the basic structure of the superconducting nanowire single-photon detector that suppresses polarization sensitivity is basically the same as in Embodiment 1. , the difference between the two is that the high reflection film 21 in the first embodiment is alternately stacked SiO 2 thin film layer 211 and Si thin film layer 212; and the high reflection film 21 described in this embodiment is alternately stacked SiO 2 Thin film layer 211 with TiO 2 Thin film layer 213 . The high reflection film 21 can be the SiO 2 The thin film layer 211 is located on the surface of the substrate 20, the TiO 2 Thin film layer 213 is located on the SiO 2 Above the thin film layer 211; also can be as Figure 4 As shown in the TiO 2 The thin film layer 213 is located on the surface of the substrate 20, the SiO 2 Thin f...

Embodiment 3

[0065] Such as Figure 5 As shown, this embodiment provides a superconducting nanowire single-photon detector that suppresses polarization sensitivity. The basic structure of the superconducting nanowire single-photon detector that suppresses polarization sensitivity is basically the same as in Embodiment 1. The difference between the two is that the high reflection film 21 described in the first embodiment is alternately stacked SiO 2 thin film layer 211 and Si thin film layer 212; and the high reflection film 21 described in this embodiment is alternately stacked SiO 2 Thin film layer 211 and Ta 2 o 5 film layer 214 . The high reflection film 21 can be the SiO 2 The thin film layer 211 is located on the surface of the substrate 20, the Ta 2 o 5 Thin film layer 214 is located on the SiO 2 Above the thin film layer 211; also can be as Figure 5 Ta 2 o 5 The thin film layer 214 is located on the surface of the substrate 20, the SiO 2 Thin film layer 211 is located on...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a superconducting nanowire single photo detector for suppressing polarization sensitivity. The superconducting nanowire single photo detector comprises a substrate, a high-reflective film, a superconducting nanowire and a medium layer, wherein the high-reflective film is arranged on a surface of the substrate, the superconducting nanowire is arranged on a surface of the high-reflective film, and the medium layer is arranged on the surface of the high-reflective film and wraps the superconducting nanowire. In the superconducting nanowire single photo detector for suppressing the polarization sensitivity, the superconducting nanowire is processed and prepared on the high-reflective film, light can directly irradiate the superconducting nanowire through front-surface optical coupling according to a device structure, the problem of remote focusing in an optical cavity structure can be avoided, the influence of a substrate Fabry-Perot cavity on absorption efficiency is further prevented, the superconducting nanowire single photo detector has relatively high absorption efficiency on a target wavelength, and the detection efficiency of the device is effectively improved; and meanwhile, in the superconducting nanowire single photo detector for suppressing the polarization sensitivity, the polarization correlation of the device can be reduced by growing the high-reflectivity medium layer which wraps the superconducting nanowire on the surface of the high-reflective film.

Description

technical field [0001] The invention belongs to the technical field of light detection, and relates to a superconducting nanowire single photon detector, in particular to a superconducting nanowire single photon detector suppressing polarization sensitivity. Background technique [0002] Superconducting Nanowire Single Photon Detector (SNSPD) is a new type of single photon detection device developed in recent years, which can realize high-efficiency single photon detection from visible light to near infrared. Due to its advantages such as high quantum efficiency, low dark count, high detection rate, and low time jitter, SNSPD has been rapidly applied in applications such as quantum information technology, laser communication, satellite-to-earth ranging, bioluminescent detection, and depth imaging. [0003] SNSPD mainly uses low-temperature superconducting ultra-thin film materials, such as NbN, Nb, NbTiN, WSi, etc. The typical thickness is about 5-10nm, and the device usual...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L39/00H01L39/02
Inventor 李浩尤立星王镇
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products