Capacitance mismatch calibration circuit and calibration method applied to single-ended sar ADC

A capacitance mismatch and calibration circuit technology, which is applied in analog/digital conversion calibration/testing, electrical components, electrical signal transmission systems, etc., can solve the problems of establishment time limit, power consumption increase, and complexity increase, and achieve saving The effect of power consumption and area

Active Publication Date: 2017-12-05
SOUTHEAST UNIV
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with large DAC (digital-to-analog converter) capacitors, settling time is limited and power consumption increases
In addition, the traditional calibration method requires a separate calibration DAC array for each capacitor that needs to be calibrated. Although the calibration DAC array only needs about 5 bits, once there are many capacitors that need to be calibrated, the capacitance of the calibration DAC array may be different from that of the DAC itself. The area occupied by the array is equivalent, which directly leads to the increase of chip cost
[0003] Although the non-binary capacitance DAC arrays in recent years can realize capacitance mismatch calibration, due to the use of non-binary capacitance DAC arrays, the matching degree of its layout will be significantly worse than that of binary capacitance DAC arrays, and in digital logic, due to the need to store each The weight of each capacitor, its complexity is also increased a lot

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitance mismatch calibration circuit and calibration method applied to single-ended sar ADC
  • Capacitance mismatch calibration circuit and calibration method applied to single-ended sar ADC
  • Capacitance mismatch calibration circuit and calibration method applied to single-ended sar ADC

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The present invention will be further described below in conjunction with the accompanying drawings.

[0045] The invention proposes to calibrate the capacitance array based on the single-end 14bit binary redundancy, and calibrates the capacitance array to improve the precision of the ADC. Since the invention is based on redundant capacitance calibration. Therefore, the redundant capacitance calibration of the single-ended SAR ADC will be described first.

[0046] figure 1 Calibration procedure for single-ended SAR ADC redundancy. It can be seen from the figure that the operation process of its non-redundant bit is exactly the same as that of a normal single-ended SAR ADC. And when converted to redundant bit C jr+ and C jr- When , first check the C in front of the redundant bit j Make a judgment, if bj is 1, enter the branch of positive compensation, namely Cjr+; if bj is 0, enter the branch of negative compensation, namely Cjr-. When entering the positive compen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a single-end SAR ADC capacitance mismatch calibration method, which can calibrate the error caused by the capacitance mismatch of the SAR ADC. This method only needs to insert two pairs of redundant capacitors in the analog domain, and compensates for capacitance mismatch in the digital domain. The binary capacitor DAC containing two pairs of redundant point capacitors includes the segmented binary capacitor DAC and the redundant capacitors Cjr+, Cjr- inserted in the lowest bit Cj of the segmented capacitor MSB segment, and the redundant capacitors Cqr+, Cqr+ inserted in the LSB segment Cqr‑. The redundant bit calculation module adds the inserted redundant bit and other normal bits to calculate an effective output of N-bit. The capacitance mismatch calibration module performs capacitance mismatch compensation on the output result. This calibration method only adds two pairs of redundant capacitors to the traditional SAR ADC structure, and the calculation of mismatch compensation is performed in the digital domain, thereby reducing the layout area and the complexity of the analog circuit.

Description

technical field [0001] The invention relates to a mismatch calibration method applied to a single-end SAR ADC capacitance, which belongs to the SAR ADC calibration technology. Background technique [0002] High-precision SAR ADC (Successive Approximation Register-type Analog-to-Digital Converter) needs to use larger capacitors to meet the requirements of capacitor matching due to the limitation of its capacitor mismatch, especially when the accuracy is higher than 12-bit. Capacitor mismatch calibration is required to address the effects of capacitor mismatch. However, with large DAC (digital-to-analog converter) capacitors, settling time is thus limited and power consumption increases. In addition, the traditional calibration method requires a separate calibration DAC array for each capacitor that needs to be calibrated. Although the calibration DAC array only needs about 5 bits, once there are many capacitors that need to be calibrated, the capacitance of the calibration D...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/10H03M1/38
Inventor 吴建辉林志伦孙杰黄成李红张萌
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products