A method for carrying out dielectric loss and capacitance measurement on a transformer without detaching incoming cables
A technology for transformers and capacitance, applied in the field of transformers, can solve the problems of not correctly reflecting the operation of the transformer, affecting the working efficiency of the transformer bushing, affecting the normal operation of the equipment, etc., to achieve safe operation and normal maintenance of manpower and material resources, and high test work efficiency , Improve the efficiency of test work
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0015] The following describes the embodiments of the present invention in further detail with reference to the accompanying drawings:
[0016] A method for measuring the dielectric loss and capacitance of a transformer with an incoming cable is in figure 1 Implemented on the measurement system shown. The measurement system mainly uses a dielectric loss tester (dielectric loss tester) and a test transformer. The low-voltage output terminal (0~50V) of the dielectric loss tester is connected to the low-voltage side of the test transformer, and the high-voltage side of the test transformer is connected to the high-voltage side of the tested transformer. The test transformer can usually use a voltage transformer with a rated transformation ratio of 10 / √3 / 0.1 / √3. The voltage output from the low-voltage output of the dielectric loss tester is boosted to the required voltage (usually 10kV) through the test transformer. And connect the high-voltage side of the test transformer to the hi...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com