Method of analyzing numerical value of influences on performance of field effect transistor amplifier by high-power pulses
A high-power pulse, field effect tube technology, applied in the direction of instruments, complex mathematical operations, semiconductor/solid-state device testing/measurement, etc., can solve the problems of neglecting the role and complex processing boundaries
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[0015] A numerical analysis method of the impact of high-power pulses on the performance of field effect tube amplifiers of the present invention, the steps are as follows:
[0016] The first step is to model and analyze the input and output integrated circuits in the field effect tube amplifier; establish a simulation model of the input and output integrated circuits, which is composed of a microstrip line network and various lumped components, and establish a The microstrip line represents the signal transmission path of the input and output integrated circuits in the field effect tube amplifier. The time domain spectral element method is used to analyze the input and output circuits of the field effect tube amplifier, and the curved hexahedron is used to divide it; The size of the lumped element is comparable to the edge size of the time-domain spectral element method. The lumped element is placed on the edge of the corresponding unit in the network, and the lumped element is a...
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