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A light-emitting diode epitaxial wafer and its manufacturing method

A technology of light-emitting diodes and epitaxial wafers, which is applied to electrical components, circuits, semiconductor devices, etc., can solve the problems of increasing non-radiative recombination of carriers, affecting antistatic ability, and reducing internal quantum efficiency, so as to improve the quality of epitaxial crystals, Effects of improving internal quantum efficiency and antistatic ability, and improving warpage

Active Publication Date: 2018-03-06
HC SEMITEK SUZHOU
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These defects will extend to the multi-quantum well layer and the P-type layer with the growth of the epitaxial layer, which not only increases the possibility of non-radiative recombination of carriers, but also introduces energy levels in the forbidden band, reducing the minority carrier lifetime, thereby reducing The internal quantum efficiency of the LED, and also affects the antistatic ability of the LED

Method used

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  • A light-emitting diode epitaxial wafer and its manufacturing method
  • A light-emitting diode epitaxial wafer and its manufacturing method

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Embodiment 1

[0022] An embodiment of the present invention provides an LED epitaxial wafer, see figure 1 , the epitaxial wafer includes a substrate (not shown), a buffer layer 10 , a 3D growth layer 20 , a 2D leveling layer 30 , an N-type layer 40 , a multi-quantum well layer 50 and a P-type layer 60 .

[0023] Wherein, the 2D leveling layer 30 includes several alternately grown first sub-layers 301 and second sub-layers 302 . One of the first sublayers 301 is in direct contact with the 3D growth layer 20 . The number of first sub-layers 301 is not less than 2 and is the same as the number of second sub-layers 302 . The first sub-layer 301 is made of undoped Al x Ga 1-x N, the second sub-layer 302 is made of undoped GaN, 0.5≤x<1.

[0024] Wherein, the thickness of the first sub-layer 301 may be in the order of nanometers, and the thickness of the second sub-layer 302 may be in the order of nanometers or in the order of microns. In the first implementation of this embodiment, the 2D le...

Embodiment 2

[0038] An embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer, see figure 2 , the method flow includes:

[0039] In step 201, a substrate is provided.

[0040] The substrate layer can be a sapphire substrate, or a Si substrate and a SiC substrate.

[0041] This step 201 also includes cleaning the surface of the substrate. When implemented, the substrate was heat-treated at 1100° C. for 8 minutes in an H2 atmosphere to clean the surface.

[0042] In step 202, a buffer layer is grown on the substrate.

[0043] When implemented, a layer of GaN with a thickness of 30nm is grown on the cleaned substrate at a temperature of 540°.

[0044] In step 203, a 3D growth layer is grown on the buffer layer.

[0045] When it is realized, the temperature is raised from 540°C to 1040°C, and a layer of non-doped GaN with a thickness of 0.5um is grown on the buffer layer.

[0046] In step 204, a 2D leveling layer is grown on the 3D...

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Abstract

The invention discloses a light emitting diode epitaxial wafer and a manufacture method thereof, and belongs to the field of a light emitting diode. The epitaxial wafer comprises a buffer layer, a 3D growth layer, a 2D filling layer, an N-type layer, a multi-quantum well and a P-type layer. The 2D filling layer comprises a plurality of first sub-layers and second sub-layers which alternatively grow, one of the first sub-layers is directly contacted with the 3D growth layer, the quantity of the first sub-layers is not smaller than two and is equal to the quantity of the second sub-layers, the first sub-layers are prepared by use of undoped Al(x)Ga(1-x)N, the second sub-layers are prepared by use of undoped GaN, and 0.5<=x<1. The method comprises the following steps: providing a substrate, successively growing the buffer layer, the 3D growth layer, the 2D filling layer, the N-type layer, the multi-quantum well and the P-type layer on the substrate, wherein the growing of the 2D filling layer comprises alternatively growing the plurality of first sub-layers and second sub-layers. According to the invention, the dislocation density caused by a mismatch of the substrate and a GaN crystal lattice can be effectively reduced, and the internal quantum efficiency and the antistatic capability of an LED are improved accordingly.

Description

technical field [0001] The invention relates to the field of light emitting diodes (Light Emitting Diode, referred to as LED), in particular to a light emitting diode epitaxial wafer and a manufacturing method thereof. Background technique [0002] In the development of the LED industry, GaN materials are typical representatives of the third-generation semiconductor materials. Because GaN materials lack homogeneous substrates, currently GaN-based epitaxial wafers are mostly grown in a heterogeneous epitaxial way, such as using sapphire substrates. [0003] The traditional GaN-based epitaxial wafer growth method is to grow an epitaxial layer on a sapphire substrate. The epitaxial layer includes a sequentially grown buffer layer, 3D growth layer, 2D leveling layer, N-type layer, multiple quantum well layer and P-type layer. Among them, the 3D growth layer is also called the roughening layer, which grows crystal islands based on the buffer layer. The 2D leveling layer, also k...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/02H01L33/00
CPCH01L33/007H01L33/025H01L33/325
Inventor 李昱桦乔楠韩杰胡加辉魏世祯
Owner HC SEMITEK SUZHOU
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