A Redundant Filter Circuit Against Single Event Transient

Abstract

The invention relates to an anti-single-particle transient redundancy filter circuit which is composed of a delay unit, a dual-input phase inverter and a redundancy unit. The delay unit adopts a phase inverter chain or a resistor-capacitor and other structures to realize delay of an input signal. The dual-input phase inverter unit can perform corresponding output according to similarities and differences of two paths of input signals. The redundancy unit has two different realization modes, the first mode is a phase inverter structure whose input is the output of the delay unit; and the second mode is a circuit structure identical with a main circuit and the input of the circuit structure is the output of the input signal and the delay unit so that a redundancy signal without interference of the main circuit is provided. According to the redundancy filter circuit, single-particle transient pulse occurring in the input signal with pulse width less than the preset delay time in a buffer device and single-particle pulse transient pulse occurring in a redundancy filter can be completely eliminated so that clock, reset, data and other key signals can be effectively protected with great single-particle transient immune function, and generation and spread of the single-particle transient pulse can be inhibited with lower circuit overhead.

Description

technical field [0001] The invention relates to a circuit, in particular to a filter circuit capable of resisting single-event transients. Background technique [0002] The radiation produced by high-energy protons or high-energy neutrons hitting the atomic nucleus and the heavy nuclear particles in cosmic rays can cause changes in the state of the circuit, such as transient pulses in combinational logic, flipping of memory-type units, etc. This effect is the effect of a single particle The result is often called single event effect. Single event effects can be divided into single event soft errors such as single event upset (SEU), recoverable single event latch (SEL), single event transient (SET), and single event burnout (SEB), single event Hard errors such as particle gate breakdown (SEGR), unrecoverable single event latch-up (SEL), etc. [0003] As the feature size of integrated circuits continues to shrink, and the supply voltage of integrated circuits decreases stead...

AI Technical Summary

Problems solved by technology

Triple-mode redundancy plus majority voting can basically eliminate the effect of single-event transients, but it will bring extremely high overhead (>200%) in area and power consumption

Time redundancy is lower in area and power consumption than triple-mode redundancy, but there are still three or more latch unit redundancy and additional speed overhead

Filtering technology is usually used at the port of the storage bank to filter out SET pulses on the input signal that are smaller than a certain pulse width. The method of filtering out single-event pulses introduces less overhead, but the filter circuit itself is vulnerable to SET damage. , the SET occurring on the output of the filter interferes with the internal circuit, causing serious errors

The traditional SET reinforcement method has a large loss in area, power consumption or performance, or the reinforcement performance is not reliable enough

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