Field calibration method of on-wafer load traction measurement system
A technology of load-pull and measurement system, applied in the field of large-signal parameter performance, which can solve the problems of lack of effective measurement measures for overall performance indicators, large differences in load-pull parameter measurement results, inconsistent curves of test output power, gain, and efficiency, etc.
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[0034] The present invention will be explained and described in more detail below in combination with specific embodiments.
[0035]A method for on-site calibration of an on-chip load pulling measurement system, specifically comprising the following steps:
[0036] In the first step, a series of mismatch attenuation monoliths with different reflection coefficients are developed as transfer standard parts, and the reflection coefficient coverage range of the transfer standard parts is: 0.1-0.8.
[0037] The present invention calibrates the developed transmission standard parts by building a calibration device, unifies the value of the on-chip load traction system, and provides a practical way to trace the source of the value of the on-chip load traction system, so the development and calibration of the transmission standard parts Work is an important link to realize the traceability of quantity and value.
[0038] In order to ensure a stable, repeatable gain characteristic tha...
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