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A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and its application

A microscopic imaging and X-ray technology, which is applied in the use of wave/particle radiation for material analysis, measuring devices, instruments, etc., can solve the problems of poor three-dimensional reconstruction accuracy, radiation damage, and no good solution, and achieve uniform beam , good coherence, and the effect of reducing the number of projections

Inactive Publication Date: 2014-10-22
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, the traditional coherent X-ray diffraction microscope imaging system is mainly built on a high-performance synchrotron radiation source, which can mainly realize a certain kind of coherent X-ray diffraction imaging, such as plane wave CDI imaging only in a non-vacuum state, and 3D reconstruction is Based on the traditional equal-angle sampling filter back projection algorithm, the accuracy of 3D reconstruction is poor
There is no good solution to the problem of radiation damage to samples

Method used

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  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and its application
  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and its application
  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and its application

Examples

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Effect test

Embodiment 1

[0040] like figure 1 , the multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device of the present invention is arranged coaxially in sequence along the direction of light beam advancement: a synchrotron radiation X-ray light source 1, an undulator 2, and a monochromator crystal arranged on an electronically controlled rotating platform 3. X-ray shutter 4, the first lifting platform and the focusing device cavity 5 arranged thereon, the vacuum pipeline 6, the second lifting platform and the multipurpose sample chamber 7 arranged thereon, the vacuum pipeline 8, and the third lifting platform And the detector 9 arranged on it, and the computer 10 for collecting data and controlling the movement of the electronically controlled translation stage; wherein the focusing device cavity is provided with a closed door on the side, and the cavity is arranged coaxially along the direction of the optical path in sequence: The horizontal focus KB mirror 11 f...

Embodiment 2

[0060] Build the same multi-purpose synchrotron radiation coherent X-ray diffraction microscope imaging device as in Example 1. The multi-purpose means that the device can be divided into X-ray focusing and non-focusing and the sample chamber has multiple working modes. This embodiment illustrates the specific experimental process and experimental parameters in the non-X-ray focusing and ventilation working mode.

[0061] Using the above-mentioned multi-purpose synchrotron radiation coherent X-ray diffraction microscope device and imaging method, the imaging process is as follows figure 2 As shown, the steps are:

[0062] The first step: if figure 1 , to build a multi-purpose synchrotron radiation coherent X-ray diffraction microscope system

[0063] Described X-ray selection energy is 8KeV, and wavelength is 0.155nm; Other parameter settings and experimental method are identical with embodiment 1 step 1;

[0064] Step 2: Light path collimation and purification

[0065] ...

Embodiment 3

[0076] Build the same multi-purpose synchrotron radiation coherent X-ray diffraction microscope imaging device as in Example 1. The multi-purpose means that the device can be divided into X-ray focusing and non-focusing modes and the sample chamber has multiple working modes. This embodiment illustrates the specific experimental process and experimental parameters under non-X-ray focusing and liquid nitrogen freezing mode.

[0077] Using the above-mentioned multi-purpose synchrotron radiation coherent X-ray diffraction microscope device and imaging method, the imaging process is as follows figure 2 As shown, the steps are:

[0078] The first step: if figure 1 , to build a multi-purpose synchrotron radiation coherent X-ray diffraction microscope system

[0079] Described X-ray selection energy is 8KeV, and wavelength is 0.155nm; Other parameter settings and experimental method are identical with embodiment 1 step 1;

[0080] Step 2: Light path collimation and purification ...

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Abstract

The invention discloses a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device. A synchrotron radiation X-ray light source, an undulator, a monochromator crystal, an X-ray shutter, a first lifting platform, a focusing device cavity, a vacuum piping, a second lifting platform, a multi-purpose sample room, a vacuum piping, a third lifting platform, a detector, and a computer which is used for collecting data and controlling an electric controlled translation platform are sequentially and coaxially arranged along the forward motion direction of light beam, wherein the monochromator crystal, the X-ray shutter and the first lifting platform are arranged on an electrical rotary platform, the focusing device cavity, the vacuum piping and the second lifting platform are arranged on the first lifting platform, the multi-purpose sample room, the vacuum piping and the third lifting platform are arranged on the second lifting platform, and the detector and the computer are arranged on the third lifting platform. According to the multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device, a low vacuum operating mode, a ventilation working mode, a freezing operating mode, X-ray focusing mode imaging or X-ray non-focusing mode imaging are achieved, the collection of three-dimension diffraction signals of samples are achieved by using a three-dimension rotating platform, a high quality three-dimension rebuilding result is obtained by using computer software, dying treatment and slicing treatment to the samples are needless, and train of thought is supplied to enrich a synchrotron radiation beam line imaging method.

Description

technical field [0001] The invention relates to a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and the application of the device for coherent X-ray diffraction imaging. Background technique [0002] Since Roentgen first discovered X-rays in 1895, X-rays have been widely used in imaging and structural analysis. Bragg used X-rays to analyze the atomic and molecular structures of crystals based on the X-ray diffraction phenomenon of crystals. After nearly 100 years of development, X-ray crystallography has played an important role in analyzing the atomic structure of crystals, but X-ray crystallography is not suitable for non-crystalline materials. As the development and extension of X-ray crystallography, coherent X-ray diffraction imaging technology is a very promising method for analyzing the three-dimensional high-resolution structure of crystal and amorphous materials. It has important application value in materials science, ph...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/207
Inventor 江怀东范家东刘宏张剑姚圣坤
Owner SHANDONG UNIV
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