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Method for simultaneously measuring broadband visible light and near-infrared radiation

A technology of near-infrared radiation and visible light, applied in optical radiation measurement, photometry, measuring devices, etc., can solve the problems of difficulty in improving measurement accuracy, low conversion efficiency, and difficulty in meeting the requirements of optical radiation measurement, achieving easy separation, High conversion efficiency, the effect of reducing accidental coincidence probability events

Active Publication Date: 2013-05-01
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0006] In recent years, an optical radiation measurement method based on correlated photons has been developed, but the current method research is limited to a certain wavelength point in the visible light band, and a continuous light source is used, the parametric down-conversion efficiency is very low, and the measurement accuracy is difficult to improve. It is difficult to meet the requirements of current optical radiation. measurement requirements

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  • Method for simultaneously measuring broadband visible light and near-infrared radiation
  • Method for simultaneously measuring broadband visible light and near-infrared radiation

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Embodiment 1

[0040] The purpose of the present invention is to provide a method for absolute measurement of optical radiation in visible light and near-infrared bands simultaneously by using correlated photons. Using PPLN (Periodically Poled Lithium Niobate Crystal) as a nonlinear medium, non-degenerate correlated photons (visible light and short-wave infrared bands) are generated through collinear phase matching, and the temperature tuning technology of nonlinear crystals is used to generate wide-spectrum correlation Photon pairs, using Si single-photon detectors and InGaAs single-photon detectors to achieve simultaneous absolute measurement of optical radiation in the visible and near-infrared bands, with a measurement uncertainty better than 1% (k=2).

[0041] The purpose of the present invention can be achieved through the following measures:

[0042] Such as figure 1 and figure 2As shown, the simultaneous absolute measurement method of wide-band visible light and near-infrared radi...

Embodiment 2

[0049] Such as figure 1 and figure 2 As shown, the tunable wide-band visible light and near-infrared radiation simultaneous absolute measurement method, for example, is a high-power ps fiber laser with a wavelength of 1030nm and a power of 10W, which is generated by KTP (potassium titanyl phosphate) crystal frequency doubling narrow linewidth single-frequency 515nm laser. One path is used as a pump source for parametric down-conversion, and the other path is used as a synchronization signal of a single photon detector through a photoelectric conversion and a delay device.

[0050] The parametric down-conversion process is realized by the 515nm laser through the PPLN nonlinear crystal to generate "771nm-1550nm" non-degenerate correlated photon pairs, and the parametric process selects collinear phase matching. By changing the temperature of the PPLN crystal, the relevant photon pairs at 780nm and 1515nm can be output.

[0051] The relevant photon pairs are respectively rece...

Embodiment 3

[0053] A method for simultaneous measurement of broadband visible light and near-infrared radiation, comprising the following steps:

[0054] A: The near-infrared high-power pulsed laser passes through the nonlinear crystal, and the frequency is doubled to generate the laser in the visible light band;

[0055] B: Divide the laser in the visible light band into two paths, one path provides a synchronization signal, and the other path generates a "visible light-short-wave infrared" non-degenerate signal and idle related photon pairs;

[0056] C: The signal light and idle light are efficiently coupled to the detector, and the pump laser, signal light, and idle light are separated spatially by the prism, and the pump light is absorbed;

[0057] D: signal light and idle light are received by InGaAs-APD single photon detector and Si-APD single photon detector respectively, and the electric current output by the InGaAs-APD single photon detector and the Si-APD single photon detector ...

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Abstract

The invention provides a method for simultaneously measuring broadband visible light and near-infrared radiation. According to the method, periodically poled crystals are used as nonlinear media, nondegenerate correlated photons (visible light and broadband infrared bands) are generated through the collinear phase matching, meanwhile, the temperature tuning technology of nonlinear crystals is utilized, correlated photon pairs of wide spectrums are generated, a Si single-photon detector and an InGaAs single-photon detector are utilized for realizing the simultaneous absolute measurement of the visible light and the near-infrared band optical radiation, and the measurement uncertainty is higher than 1 percent (k=2).

Description

technical field [0001] The invention relates to a method for measuring broadband visible light and near-infrared radiation, in particular to a method for simultaneous absolute measurement of broadband visible light and near-infrared radiation. Background technique [0002] The absolute measurement of optical radiation is of great significance in the fields of quantitative remote sensing, climate monitoring, photoelectric metrology, and spectral radiometry, and is also the basis for quantitative applications of all photodetection devices and photoelectric measuring instruments. At present, the measurement of electrical signals has achieved very high precision, while the measurement precision of photons is far less than that of electrons. There are two approaches to the absolute measurement and transmission of optical radiation, one is to use a black body as a standard radiation source, and the other is to use a cryogenic radiometer as a standard detector. The absolute radian...

Claims

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Application Information

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IPC IPC(8): G01J1/00
Inventor 史学舜杨乐臣陈坤峰曾和平李健军刘玉龙
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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