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Method for aligning by combining lenses with multiple magnifications in direct-writing photoetching machine

A direct-write, lithography technology, applied in microlithography exposure equipment, optics, optical components, etc., can solve the problems of difficult to find alignment marks and low alignment accuracy, so as to improve exposure production efficiency and improve accuracy. Quasi-accuracy and the effect of improving the accuracy of the relative positional relationship between layers

Inactive Publication Date: 2013-02-13
ADVANCED MICRO LITHO INSTR INC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a method for aligning multiple magnification lenses in a direct-writing lithography machine to solve the problems of difficulty in finding alignment marks and low alignment accuracy in the prior art

Method used

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  • Method for aligning by combining lenses with multiple magnifications in direct-writing photoetching machine
  • Method for aligning by combining lenses with multiple magnifications in direct-writing photoetching machine
  • Method for aligning by combining lenses with multiple magnifications in direct-writing photoetching machine

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Embodiment Construction

[0023] The purpose of the present invention is to provide a method for aligning multiple magnification lenses in a direct-write photolithography machine to address the shortcomings of the prior art. As one of the more preferred embodiments, the technical solution of the present invention may include:

[0024] (1) First, add a lens converter between the objective lens and the optical path of the direct writing lithography machine;

[0025] (2) Then install the 5x, 10x, 20x and 50x lenses on the lens converter in turn as the alignment lens;

[0026] (3) Use a 5X lens to find the alignment mark, and move the alignment mark to the center of the field of view, then use a 10X lens and a 20X lens to find the alignment mark and move the alignment mark to the center of the field of view;

[0027] (4) Find the alignment mark under the 50X lens and move the alignment mark to the center of the field of view, and then extract the center coordinates of the alignment mark.

[0028] Specifi...

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Abstract

The invention discloses a method for aligning by combining lenses with multiple magnifications in a direct-writing photoetching machine, and the method comprises the following steps of: (1) additionally arranging at least one lens converter between the objective lens and optical path of the direct-writing photoetching machine; (2) sequentially installing 5-magnification, 10-magnification and 20-magnification lens on the lens converter; (3) finding an alignment mark through the 5-magnification lens, moving the alignment mark to a view field center, and then sequentially finding alignment marks through the 10-magnification and the 20-magnification lens and moving the alignment marks to the view field center; (4) finding the alignment mark through a 50-magnification lens, moving the alignment mark to the view field center, and then extracting the center coordinates of the alignment marks. The method disclosed by the invention has the advantages of enhancing the accuracy of the relation of interlaminar relative positions of an exposure pattern by enhancing the alignment accuracy, solving the problem of difficult finding of the alignment marks when using a low-magnification single objective lens and increasing the exposure production efficiency of photoetching machines.

Description

technical field [0001] The invention specifically relates to a method for aligning multiple magnification lenses in a direct-writing photolithography machine, which belongs to the field of photolithography machine alignment control. Background technique [0002] The alignment control system of the direct-write lithography machine reflects the illumination light source to the surface to be processed through the spatial light modulator (SLM), and then uses the image sensor (CCD) to collect the reflected light on the surface to be processed to obtain alignment. graphics information, and then calculate the coordinates of the graphics center through the acquired graphics information. Calculate the offset of the surface to be processed relative to the motion platform of the lithography machine according to the center coordinates of multiple alignment patterns on the surface to be processed, and compensate in the exposure system. [0003] The direct-write lithography machine is a ...

Claims

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Application Information

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IPC IPC(8): G03F7/20G03F9/00G02B7/14
Inventor 彭丹花
Owner ADVANCED MICRO LITHO INSTR INC
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