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Surface defect detecting system of crystalline silicon polished wafer

A technology for defect detection and polishing, which is applied in the direction of optical testing for defects/defects, can solve problems such as high price, limited resolution, complex system, etc., and achieve the effects of increasing competitiveness, improving detection speed, and improving production efficiency

Active Publication Date: 2012-08-01
上海信智精密光学有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to overcome the shortcomings of existing crystal silicon polished surface detection equipment, such as limited defect resolution capability, complex system, and high price, the present invention provides an optical automatic detection system with high resolution capability for crystal silicon polished surface defect detection

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  • Surface defect detecting system of crystalline silicon polished wafer
  • Surface defect detecting system of crystalline silicon polished wafer
  • Surface defect detecting system of crystalline silicon polished wafer

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Embodiment Construction

[0031] The embodiments of the present invention are described in detail in conjunction with the accompanying drawings: this embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following the embodiment.

[0032] refer to Figure 1 ~ Figure 3 A surface defect detection system for a polished crystal silicon wafer includes a laser module, an optical scanning module, a pattern detection module, a movement module for a polished crystal silicon wafer, and a display and control module. The laser module is connected with the optical scanning module, the optical scanning module is fixed on the side above the polished crystal silicon wafer to be detected, and the pattern detection module is fixed on the polished silicon wafer to be detected with a π / 2 radian relative to the The other side of t...

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Abstract

Disclosed is a surface defect detecting system of a crystalline silicon polished wafer. The detecting system comprises a laser module, an optical scanning module, an image detecting module, a crystalline silicon polished wafer moving module and a display control module, wherein the laser module is connected with the optical scanning module which is fixed on one side above a crystalline silicon polished wafer to be detected, the image detecting module is fixed on the other side opposite to the optical scanning module above the crystalline silicon polished wafer to be detected in a radian of pi / 2 and connected with the display control module, and the crystalline silicon polished wafer moving module is connected with the display control module. According to the surface defect detecting system of the crystalline silicon polished wafer, characteristics of laser coherence, direction concentration and high resolution are used for the surface defect detection of the crystalline silicon polished wafer combined with methods of mechanical and electronic integration and image algorithm, so that defects of small cracks, fine particles, contamination, convex-concave, and the like on the surface of the crystalline silicon polished wafer can be detected, and reliable quality test for production of integrated circuits and solar photovoltaic cells is guaranteed.

Description

technical field [0001] The invention relates to the field of automatic optical detection and control, in particular to an automatic optical detection system for surface defects of crystal silicon polished wafers. Background technique [0002] With the development of economy, the sharp contradiction between energy shortage and environmental pollution has become a problem that all countries in the world are facing. Among the many new energy sources, solar energy has the advantages of clean and pollution-free, safe and reliable, less constraints, inexhaustible, sustainable utilization, etc., so it has incomparable advantages. With the gradual maturity and popularization of solar photovoltaic power generation technology, the demand for solar photovoltaic cells will show an exponential growth. On the other hand, with the in-depth development of information technology, the demand for integrated circuits is also increasing year by year. The processing and testing technology of po...

Claims

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Application Information

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IPC IPC(8): G01N21/88G01N21/95
Inventor 潘国兵张洪涛蒋建东
Owner 上海信智精密光学有限公司
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