TDI (Time Delay Integration) scan imaging method for Snapshot type area array infrared detector
An infrared detector, scanning imaging technology, applied in radiation pyrometry, instrumentation, image enhancement and other directions, can solve the problems of image smearing, the influence of line targets on target detection, and blurred scanning direction of point targets, so as to improve the information. The effect of noise ratio
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[0043] The TDI scanning imaging method of the Snapshot type area array infrared detector of the present invention is realized by an optical-mechanical scanning structure, an area array type infrared focal plane array, a driving circuit, a time-delay integration circuit and a power management circuit, and finally outputs a required video image. The optical-mechanical scanning structure, driving circuit, delay integration circuit and power management circuit are prior art. The delay integration circuit is composed of a sampling circuit and a digital processing circuit. Figure 4 It is a block diagram of the structure of the present invention. The sampling circuit is composed of TI's analog-to-digital conversion device AD9240 and peripheral circuits, which are controlled by FPGA to complete the sampling. The digital processing circuit is mainly composed of FPGA model EP2S60F1020I4, two static memories model IS61WV102416BLL and peripheral circuits. Figure 5 It is the block diag...
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