Substance identification method of ion mobility spectrum (IMS) detection instrument based on ion diagram sequence
A technology of ion mobility spectrometry and identification method, which is applied in the field of trace substance detection, can solve the problems of false alarm and misleading of inspectors using the instrument, and achieves the effect of strong resolution ability and low false alarm rate.
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example 1
[0054] Figure 5-12 It exemplarily shows that after a mixture of 50ng bimodal substance A and 30ng unimodal substance B is fed into a portable IMS detector in a certain experiment, the process and results of this method for the continuous 8 ion maps output by the instrument are shown. Figure 5 a- Figure 12 a The 8 ion maps are given in sequence, the time interval between two adjacent ion maps is 1 second, and each ion map is obtained by averaging 10 consecutive ion maps without time intervals.
[0055] Peak-finding algorithm and environmental compensation method. The software of the instrument adopts the peak-finding algorithm based on wavelet transform, Figure 5 b- Figure 12 b is the Figure 5 a- Figure 12 The ion maps shown in a are the results obtained by wavelet transform respectively, and the material peak positions and peak heights are extracted from the ion maps after wavelet transform. The peak-finding threshold set in the software of the instrument is 60, a...
example 2
[0065] Figure 13-20 It exemplarily shows that after 50ng of bimodal substance A is injected into a portable IMS detector in a certain experiment, the processing process and results of the continuous 8 ion diagrams output by the instrument are shown by this algorithm. Figure 13 a- Figure 20 a The 8 ion maps are given in sequence, the time interval between two adjacent ion maps is 1 second, and each ion map is obtained by averaging 10 consecutive ion maps without time intervals.
[0066] Peak-finding algorithm and environmental compensation algorithm. The software of the instrument adopts the peak-finding algorithm based on wavelet transform, Figure 13 b- Figure 20 b is the Figure 13 a- Figure 20 The ion maps shown in a are the results obtained by wavelet transform respectively, and the material peak positions and peak heights are extracted from the ion maps after wavelet transform. The peak-finding threshold set in the software of the instrument is 60, and a peak i...
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