Spectral analysis method

Abstract

The embodiment of the invention relates to a spectral analysis method in the field of element spectral analysis. The method comprises the following steps: analyzing the spectrum of a guide sample, and determining the relationship between a peak wavelength and a peak position and the relationship between the peak wavelength and a peak width; calculating possible peak positions and peak width in the excitation spectrum of elements contained in a sample to be tested by the determined relationships; carrying out peak searching in the whole spectral range of the sample to be tested, comparing a peak position obtained by peak searching with the calculated peak position, and comparing a peak width obtained by peak searching with the calculated peak width so as to determine whether a complete overlapped peak exists or not and determine the width of an overlapping region; carrying out peak decomposition in each overlapping region and calculating the mathematical expressions of a gauss function and a background function; and carrying out spectral analysis by utilizing the obtained gauss function and the background function. The embodiment of the invention achieves the purpose of peak decomposition, and provides more accurate and detailed data for subsequent elemental analysis and quantitative analysis.

Description

technical field [0001] The invention relates to the field of element spectrum analysis, in particular to an X-ray fluorescence spectrum analysis method. Background technique [0002] Fluorescence analysis technology is widely used in non-destructive rapid analysis and detection of elements in non-ferrous metals, cement, geological exploration, traceability and other industries. Among them, X-ray fluorescence spectrum analysis is the key to X-ray fluorescence analysis technology. Identifying spectral peaks and extracting characteristic parameters are important steps to analyze the elements and their contents of the measured object. If the elements of the measured object are complex, the corresponding matrix effect will be Seriously, there are interferences such as tailing, overlapping, and scattering background at the peak of the fluorescence spectrum, which distorts the peak and affects the accuracy of subsequent analysis. [0003] Therefore, the existing X-ray fluorescence...

AI Technical Summary

Problems solved by technology

Among them, X-ray fluorescence spectrum analysis is the key to X-ray fluorescence analysis technology. Identifying spectral peaks and extracting characteristic parameters are important steps to analyze the elements and their contents of the measured object. If the elements of the measured object are complex, the corresponding matrix effect will be Seriously, there are interferences such as tailing, overlapping, and scattering background at the peak of the fluorescence spectrum, which distorts the peak and affects the accuracy of subsequent analysis

[0003] Therefore, the existing X-ray fluorescence spectroscopic analysis technology is not accurate enough for the positioning and quantitative analysis of elements

Images