Photoelectric double-pulse laser induced breakdown spectrograph and spectral analysis method

Abstract

The invention discloses a photoelectric double-pulse laser induced breakdown spectrograph, comprising a pulse laser, a focusing lens, a movable platform, a discharge electrode, an optical diode, a pulse time-delay controller, a high-voltage pulse power supply, an optical collection system of optical radiation, a monochromator or a spectrograph, a photoelectric conversion element, a data collection unit and an electronic computer. The invention also discloses a spectral analysis method of the photoelectric double-pulse laser induced breakdown spectrograph. The photoelectric double-pulse laser induced breakdown spectrograph can greatly enhance the spectral analysis sensitivity.

Description

technical field [0001] The invention belongs to the technical fields of applied spectrum technology, spectrum analysis, detection and measurement, and specifically relates to a photoelectric double-pulse laser-induced breakdown spectrometer and a spectrum analysis method. Background technique [0002] Laser-induced breakdown spectroscopy (LIBS) technology is to focus a beam of high-energy pulsed laser on the surface of a certain substance to be analyzed to generate high-temperature plasma, and a small amount of material stripped by the laser is in the high-temperature plasma. Be atomized and ionized, and emit the characteristic spectral radiation of atoms or ions. The analysis of the element concentration (or content) in the sample is realized by analyzing the spectral intensity. This technology has the characteristics of no complicated sample pretreatment process, fast, industrial online and remote analysis, etc. However, the analytical sensitivity of single-pulse LIBS te...

AI Technical Summary

Problems solved by technology

Double-pulse LIBS requires two pulsed lasers. The first disadvantage is that the system is complex and the cost is high. The second disadvantage is that the pulse width of the optical pulse cannot be adjusted arbitrarily, and the wavelength is also limited, so these physical parameters cannot be optimized essentially.

Existing spectroscopic analysis methods either require complex sample pretreatment processes, are time-consuming and cannot achieve rapid detection (such as atomic absorption spectroscopy, inductively coupled plasma-atomic generation spectroscopy, inductively coupled plasma-mass spectrometry ); or although it can achieve fast analysis, but the sensitivity is not high (such as x-ray fluorescence, single pulse LIBS technology, etc.)

The purpose of the present invention is to solve the technical problem of low analytical sensitivity of existing LIBS technology (including single-pulse LIBS and double-pulse LIBS technology), thereby realizing the rapid analysis of trace elements in various samples

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