Testing device

Abstract

The invention relates to a testing device which is suitable to test a plurality of different types of boards to be tested. The testing device comprises a programmable testing platform and a storage cell. The programmable testing platform comprises a programmable system chip, a storage cell and an input / output cell, wherein the storage cell is electrically connected to the programmable system chip, and an operating system is stored in the storage cell. The input / output cell is electrically connected to the programmable system chip, one of the boards to be tested, and the storage cell. The input / output cell is suitable to produce a starting signal according to an input operation, and the programmable system chip is suitable to select a preset testing process according to the starting signal and to test the board to be tested and electrically connected to the input / output cell according to the preset testing process. The storage cell is used for storing a testing result output by the programmable system chip. The testing device can lower the testing cost and shorten the testing time.

Description

technical field [0001] The present invention relates to a test device, in particular to a test device capable of testing various boards under test (Unit Under Test, UUT), which can reduce test cost and test time. Background technique [0002] see figure 1 Shown, is the block diagram of a kind of testing device of prior art. The conventional test device 100 includes a host computer (Host PC) 110 , a test board 120 and a shop floor information system (SFIS) 130 . The host computer 110 is electrically connected to the testing board 120 and the on-site real-time information system 130 , and the testing board 120 is used to electrically connect to a board under test 50 . [0003] The testing and updating of the conventional testing device 100 is controlled by the host computer 110 , and the testing board 120 cannot independently test the board 50 to be tested. Therefore, the testing procedure in the prior art is to start the testing process through the host computer 110 and to...

AI Technical Summary

Problems solved by technology

[0005] Because the existing conventional technology needs to develop many test boards 120, it is costly

In addition, when testing different boards 50 to be tested, the test board 120 needs to be replaced, so it is time-consuming.

In addition, when setting up the host computer 110, it is necessary to install the operating system (Operating System, OS), drivers and related software, and also configure the network, so it will take a lot of time

[0006] Based on the above, the existing conventional technology has the disadvantages of high test cost and long test time

[0007] It can be seen from this that the above-mentioned existing testing device obviously still has inconvenience and defects in structure and use, and needs to be further improved urgently

In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and the general products do not have a suitable structure to solve the above-mentioned problems. Urgent problem

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