Multi-test point semiconductor test machine station automated setting method

Abstract

An automatic setting method for a multi-ports semiconductor test apparatus for different test products comprises the following steps of: making the complicated steps of test procedure, information of test products and parameters' setting of the apparatus into corresponding image files respectively corresponding to the test products so that the image file is managed by the test apparatus; inputting the identity code on each to-be-tested plate before the product test to start the a series of automatic test procedures. The method can greatly reduce the complicated setting before the product test so as to further ensure the correctness and integrity, and greatly improving the effectiveness of management and efficiency of product test.

Description

Technical field: [0001] The present invention relates to an automatic setting method of a multi-test port semiconductor test machine, in particular to a method in which each test base can be powered on remotely to perform automatic testing without installing a hard disk, an optical drive or a floppy drive. Background technique: [0002] Integrated circuit (IC) components have become the indispensable core of almost all electronic equipment, so the reliability of IC has undoubtedly become an extremely important link in determining the reliability of electronic equipment. [0003] At present, the automated test machines used to test ICs can be roughly divided into three types: the test base provides simulated signals and captures the output signals of each output pin for simulated tests; A real-world test that puts the IC under test into an actual use environment. [0004] Although the simulation test can obtain the complete electrical characteristics of the IC to be tested, ...

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Problems solved by technology

The disadvantages of this testing method are:

[0008] On the one hand, every time the production line is started, the operator needs to set the state parameters of each test base 11 by the central control module 10, and the same is true for changing the production line. Difficulties in management also make it difficult to improve test efficiency

[0009] On the other hand, after the frequent testing of the power-on / off process, the hard disks of each test base 11 are prone to problems or even damage. Whether the operator swaps the hard disks of the two test bases or updates the damaged hard disk, it is necessary to update the hard disk. Content, a little carelessness will cause the test program to be inconsistent or not corresponding to the tested product, which will affect the correctness of the updated test results

If you mistakenly test a qualified product as a substandard product, you will only lose one IC; on the contrary, if you mistakenly test an unqualified IC as qualified and install it in the actual use environment, it will undoubtedly damage the overall reliability of the electronic device. Not only will it cause a lot of trouble to subsequent users, but it will also damage the reputation of electronic equipment manufacturers and bring unnecessary economic losses to them

[0010] Moreover, as mentioned above, due to the large number of production lines in the factory, after a single product test is completed, the test product on the production line may also be replaced; every time the replacement is performed, the operator needs to set and change the data of each test base one by one. cause the above inconsistencies

In addition, since each operator needs to pay attention to multiple (rather than one) test machines at the same time, the probability of occurrence of problems is multiplied proportionally

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