P-type nitrogen-doping cuprous oxide thin film material and preparation method thereof
A cuprous oxide, thin-film material technology, applied in metal material coating process, semiconductor/solid-state device manufacturing, ion implantation plating, etc. High-level problems, to achieve the effect of simple manufacturing process, increased hole concentration, and high hole concentration
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Embodiment 1
[0013] A kind of P-type nitrogen-doped cuprous oxide film material, its molecular formula is Cu 2 O:N, the deposition process is as follows: 1) The target material is a copper disc with a purity of 99.99%, a thickness of 3.6mm, and a diameter of 50mm. The purity is 99.999%; 2) The distance between the magnetron sputtering target and the substrate is 5cm, and the back-bottom pressure of the deposition chamber is 1.2×10 -3 Pa. During deposition, the substrate temperature is normal temperature, the flow rates of oxygen, nitrogen, and argon are 20, 30, and 80 sccm respectively, and the working pressure in the deposition chamber is controlled to 1.0 Pa by adjusting the valve; 3) The sputtering voltage is 400V, and the current is 50mA , the power is 20W; the film deposition time is 20 minutes.
[0014] The results of the Hall effect test show that the resistivity of the thin film material is 1.2 Ω cm, and the hole concentration is 3.8×10 19 / cm 3 .
Embodiment 2
[0016] A P-type nitrogen-doped cuprous oxide thin film material is characterized in that: the thin film material is nitrogen-doped cuprous oxide, and its molecular formula is Cu 2 O:N. The deposition process is as follows: 1) The target material is a copper disc with a purity of 99.99%, a thickness of 3.6mm, and a diameter of 50mm. %. 2) The distance between the magnetron sputtering target and the substrate is 5cm, and the back pressure of the deposition chamber is 1.2×10 -3 Pa. During deposition, the substrate temperature was 100°C, the flow rates of oxygen, nitrogen, and argon were 20, 30, and 80 sccm respectively, and the working pressure in the deposition chamber was controlled to 1.0 Pa by adjusting the valve; 3) The sputtering voltage was 400V, and the current was 50mA, power 20W; film deposition time 20 minutes. The test results show that the resistivity of the thin film material is 4.07Ω·cm, and the hole concentration is 4.0×10 19 cm -3 .
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