Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Imaging interference photo etching method using two quadrature acousto-optic modulators and photo etching system

An acousto-optic modulator and imaging interference technology, which is applied in the improvement field of imaging interference lithography technology, can solve the problems of low exposure efficiency and unfavorable popularization and application, and achieve the effects of improving exposure efficiency, shortening exposure time, and convenient operation

Inactive Publication Date: 2009-07-22
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are too few studies on the specific implementation system and the practical application of the system. Generally, the adjustment of the optical path between exposures is used to achieve three exposures. Image alignment is the key issue that has not been resolved, and the exposure efficiency is not high, which is not conducive to popularization and application.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Imaging interference photo etching method using two quadrature acousto-optic modulators and photo etching system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] Such as figure 1 As shown, the present invention includes a laser 1, a first acousto-optic modulator 2 and a second acousto-optic modulator 3, an acousto-optic modulator power supply 4, a first perforated total reflection mirror 5, a second perforated total reflection mirror 6, The first electric exposure shutter 7, the second electric exposure shutter 7', the third electric exposure shutter 7", the first total reflection mirror 8, the second total reflection 9, the first spatial filter beam expander collimator 10, the second space The filter beam expander collimator 11, the third spatial filter beam expander collimator 12, the mask 13, the imaging optics 14, and the resist substrate 15 are added to the first acousto-optic modulator at the acousto-optic modulator power supply 4 2 and the driving voltage V on the second acousto-optic modulator 3 1 =V 2 = 0, the laser beam emitted by the laser 1 directly passes through the first acousto-optic modulator 2 and the second acoust...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The imaging interference lithography method and photolithography system using two orthogonal acousto-optic modulators are characterized in that two orthogonal acousto-optic modulators are used to deflect the laser beam emitted from the laser, and when the acousto-optic modulator is on When no ultrasonic power is applied, the laser light directly passes through the acousto-optic modulator to provide vertical illumination for the mask; when the acousto-optic modulator is supplied with ultrasonic power of a certain frequency, it produces first-order diffracted light whose deflection angle is proportional to the ultrasonic frequency , to provide illumination for offset exposure in the horizontal direction and offset exposure in the vertical direction. By changing the ultrasonic power, the intensity of the first-order diffracted light can be easily adjusted, and the exposure intensity control without attenuating filters can be realized. The deflection can be controlled in real time by changing the ultrasonic frequency. The size of the angle can conveniently, flexibly and quickly realize three exposures of imaging interference lithography, and produce high-fidelity resist patterns.

Description

Technical field [0001] The invention relates to an imaging interference lithography method and a lithography system using two orthogonal acousto-optic modulators, and belongs to the improvement of the imaging interference lithography technique for generating fine patterns. Background technique [0002] Imaging interference lithography technology is a new technology that improves the resolution of lithography. Its main feature is to use three exposures to expose the low-frequency components of the mask pattern, the high-frequency components in the x direction and the y direction, and optimize the relative exposure intensity. Improve the resolution of photolithography and improve the quality of exposed graphics. The general imaging interference lithography system consists of laser, beam splitter, mirror, spatial filter, beam expander collimator, mask, imaging optical lens and resist substrate, etc. Document Xiaolan Chen and S. RJ Brueck Imaging Interferometric lithography for arbit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G03F7/20G02B27/00
Inventor 冯伯儒张锦宗德蓉
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products