Device for detecting 80C31 single particle effect
A single event effect and test program technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as inability to correctly judge the number of flips, burnt devices, CPU calculation errors, etc., and achieve fast and reliable data exchange. Adjustable test time and highly modifiable effects
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[0022] Such as figure 1 As shown, it is a schematic diagram of the device structure of the present invention, including a power module, an upper computer, a main testing CPU, a measured 80C31, a dual-port RAM, an SRAM, and a current acquisition card; the power module includes RC filtering, D / C conversion, and a relay; the external The power supply is divided into two paths after RC filtering and D / C conversion, one path directly supplies power to the main test CPU, and the other path supplies power to the tested 80C31 through a relay. The current acquisition card collects the current supplied to the tested 80C31 and sends the collected current value to For the host computer, in order to achieve millisecond-level sampling time, the current acquisition card can use the 1609 product produced by TI Company of the United States; when the current value exceeds the preset threshold, a latch occurs, and the host computer sends an instruction to the relay. The relay will power off the ...
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