Domino logic testing systems and methods

Abstract

A domino logic test circuit includes a dynamic node, a precharge device for charging the dynamic node, and an output inverter for inverting an output of the dynamic node. A logic network is coupled to the dynamic node for discharging the dynamic node in accordance with logic. A footer device enables and disables the logic network. A keeper device is coupled to the dynamic node for retaining a charge state of the dynamic node while awaiting the logic network to operate in accordance with the logic. A test mode selection device is coupled to the dynamic node and is configured to enable a latch in the test mode. A phase selection device is configured to receive at least a wait signal and to enable selection of at least a precharge phase for charging the dynamic node to a voltage level, a write phase for generating a value to the latch based on the logic and the voltage level of the dynamic node, and a wait phase for enabling reading the value. The selection is based, at least partially, on the wait signal state.

Description

RELATED APPLICATIONS[0001]Not ApplicableFEDERALLY SPONSORED RESEARCH OR DEVELOPMENT[0002]Not ApplicableCOMPACT DISK APPENDIX[0003]Not ApplicableBACKGROUND OF THE INVENTION[0004]Dynamic logic circuits have become prevalent in high performance integrated circuits because they offer faster switching speeds and a smaller area than static logic circuits. Dynamic logic circuits generally use complementary metal oxide semiconductor (CMOS) devices.[0005]As depicted in FIG. 1, a dynamic logic circuit 102 includes a p-type channel MOS (PMOS) precharge transistor 104 coupled to a voltage source 106 having a voltage level (Vdd), an n-type channel MOS (NMOS) logic network 108, and an NMOS footer transistor 110 coupled to ground 112. The output is measured at a dynamic node 114. The circuit operation is controlled by a clock signal (CLK) that is applied to both the PMOS precharge transistor 104 and the NMOS footer transistor 110.[0006]The dynamic logic circuit 102 has two phases of operation. Whe...

AI Technical Summary

Benefits of technology

The solution enables effective detection of faults in keeper and footer transistors, improving the reliability and robustness of domino logic circuits by accelerating charge leakage effects and maintaining the precharge state, thus enhancing fault detection feasibility.

Problems solved by technology

Unfortunately, the transistor gates of dynamic logic circuits cannot be directly cascaded.

Dynamic logic circuits also have problems with charge leakage and charge sharing.

However, the keeper transistor 218 results in a performance reduction of the circuit due to the keeper transistor's added parasitic capacitance 220 at the dynamic node 214.

While testing static CMOS circuits has received a lot of attention, little attention has been paid to testing dynamic CMOS circuits.

Testing faults in domino logic circuits is a challenge due to their susceptibility to noise and their unique circuit topology.

Therefore, tests based on purely logical fault models cannot be used to test them.

This results in a large number of faults in the footer and keeper transistors that are untestable using conventional tests that are based on purely logical fault models.

The lack of an acceptable fault model for domino logic circuits contributes to the complexity of testing them.

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