Measurement apparatus and a method of using measurement apparatus

Abstract

A method of measurement using a measurement probe system includes the steps of (i) providing a measurement probe system having a measurement probe to a user, the measurement probe system being suitable for use with co-ordinate positioning apparatus and (ii) monitoring usage of the measurement probe system.

Description

[0001]This nonprovisional application claims the benefit of U.S. Provisional Application No. 60 / 996,984, filed Dec. 13, 2007. This application also claims priority from European patent application 07252959.7 filed Jul. 26, 2007 and from European patent application 07252965.4 filed Jul. 26, 2007. The disclosure of each of the provisional application and of the two listed priority European applications is incorporated herein by reference in its entirety.INTRODUCTION[0002]The present invention relates to measurement apparatus and to methods of using such measurement apparatus. In particular, the invention relates to measurement probes and methods of use thereof.BACKGROUND OF THE INVENTION[0003]In the field of industrial metrology, it is known to use co-ordinate positioning apparatus to accurately measure or inspect the dimensions of an object such as a workpiece. To perform such a measurement function, co-ordinate positioning apparatus moves a measurement probe around within the workin...

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Benefits of technology

[0009]The present invention has arisen from the recognition that the relatively high upfront cost of providing measurement probe systems, such as measurement probes and associated probe interfaces, is often a substantial disincentive to potential users who are unaware of the benefits of incorporating such apparatus into their production processes. Although it is known to provide hire purchase or loan arrangements that allow the purchase cost to be spread over a longer period, such arrangements do not reduce the total financial commitment that is associated with such purchases but merely reduces the upfront cost. The method according to the first aspect of the invention thus permits a manufacturer to sell a measurement probe system at a lower cost than traditionally possible and to recoup the reduction in upfront income by charging those users that make ongoing use of the measurement system. This recouping of income is achieved through the step of monitoring usage of the measurement probe system. The invention thus extends the market for measurement systems to lower end machine tool users, without the need to reduce the metrology performance of such systems. Furthermore, end users also benefit as they are able to assess the productivity improvements that can be obtained with measurement probe based systems without having to risk substantial sums of upfront capital.

[0020]The invention, in the second aspect, thus comprises a method of providing a measurement probe system to a user and prohibiting use of that system after a certain amount of measurement probe usage. The prohibition may arise from an agreement with the user to cap or restrict usage or, as described in more detail below, the measurement probe system may be arranged to prevent further usage once the system has been used for the predetermined amount of measurement probe system usage. This permits lower upfront cost measurement probe systems to be provided to users, with the manufacturer recouping the lost upfront income by requiring further user payments to extend the usage limit or to replace components of the system.

[0023]Conveniently, the acquisition of measurements using the measurement probe system is prevented by powering the measurement probe using a non-replaceable power source (e.g. a battery) such that the acquisition of measurements is prevented once the power source is exhausted. The measurement probe may be provided in first and second parts as described above, with the non-replaceable power source being included in the first part.

[0029]In summary, the present invention offers the potential to increase the market for measurement probe systems without having to compromise on the accuracy or quality of such systems. From a user's perspective, the lower upfront cost provided by the method reduces the financial risk associated with the acquisition of measurement probe systems thereby making such systems a more attractive option.

Problems solved by technology

Although it is known to provide hire purchase or loan arrangements that allow the purchase cost to be spread over a longer period, such arrangements do not reduce the total financial commitment that is associated with such purchases but merely reduces the upfront cost.

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