Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method of forming thin metal films on substrates

a technology of thin metal film and substrate, which is applied in the direction of semiconductor/solid-state device details, transportation and packaging, coatings, etc., can solve the problems of inconvenient forming, inconvenient forming, and inability to meet the requirements of the application, etc., to achieve convenient forming, convenient forming, and sufficient conductivity

Inactive Publication Date: 2007-06-21
EBARA CORP
View PDF14 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a solution containing a metal component, which can be easily and inexpensively formed and can be adjusted in conductivity and thickness. The solution contains composite ultrafine metal particles with a core made of a metal component and a covering layer made of an organic compound chemically bonded to the core. The particles have a small size and can be uniformly dispersed in a solvent. The solution can be used to form a thin metal film on a substrate by evaporating the solvent and thermally decomposing the coating layer. The method is simple and can be carried out with a low-level vacuum system.

Problems solved by technology

While the plating technology is inexpensive and technically highly complete, the electrolytic plating process allows films to be grown on only conductive materials, and the electroless plating process is open to environmental pollution as materials contained in the plating solution adversely affect the natural environment and the working and labor environment.
If a thin metal film is formed of a conventional metal paste as interconnections on a ceramic substrate, then the conductivity is limited to a certain level because the thin metal film is rendered conductive by point-to-point contact between metal particles.
The thicker metal film is more expensive to manufacture.
However, available processes of producing ultrafine metal particles are of low productivity.
The processes of producing ultrafine metal particles also disadvantageous in that it is difficult to keep the ultrafine particles in safe storage because once the solvent is evaporated, the particles stick to each other and cannot be reused.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method of forming thin metal films on substrates
  • Method of forming thin metal films on substrates
  • Method of forming thin metal films on substrates

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0082] As shown in FIGS. 1A and 1B, a composite ultrafine metal particle 14 comprising a core 10 substantially made of a metal component and a covering layer 12 made of an organic compound is prepared. The composite ultrafine metal particle 14 is stable because it has the covering layer 12 made of an organic compound, and is less liable to be aggregated in a solvent.

[0083] The composite ultrafine metal particle 14 is composed of the organic compound and the metal component which derives from a metal salt as a starting material, e.g., a carbonate, a formate, or an acetate. The core 10 is made of the metal component, and surrounded by the covering layer 12 of the ionic organic compound. The organic compound and the metal component are partly or wholly chemically coupled to each other. The composite ultrafine metal particle 14 is highly stable, and stable in a higher metal concentration, unlike the conventional ultrafine particles which are stabilized by being coated with a surface ac...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
particle diameteraaaaaaaaaa
thicknessaaaaaaaaaa
diameteraaaaaaaaaa
Login to View More

Abstract

A solution containing a metal component of composite ultrafine metal particles each having a core substantially made of metal component and a covering layer made of an organic compound chemically bonded to the core having an average diameter ranging from 1 to 10 nm, uniformly dispersed in a solvent, forms a thin metal film on the surface of a transfer sheet, after which the transfer sheet is thermally decomposed to transfer the thin metal film to a substrate.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to a solution containing a metal component, and a method of and an apparatus for forming a thin metal film, and more particularly to a solution containing a metal component for use in forming a conductive thin metal film on a semiconductor substrate of silicon or the like, and a method of and an apparatus for forming a thin metal film using such a solution, and a method of and an apparatus for forming a thin metal film in embedding a conductive metal such as copper (Cu) or the like in minute interconnection recesses defined in the surface of a substrate of silicon or the like thereby forming interconnections. [0003] 2. Description of the Related Art [0004] Aluminum or aluminum alloys are generally used as metal materials for forming interconnection circuits on semiconductor substrates. One recent trend is to use copper as such a metal material for forming interconnection circuits. Since...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): B05D3/02H01L21/20B22F1/052B22F1/054B22F1/0545B22F1/10B22F1/102C23C4/12H01L21/00H01L21/288H01L21/768H01L23/532
CPCB22F1/0014B22F1/0018B22F1/0022B22F1/0059B22F1/0062B22F2998/00B82Y30/00C23C4/121C23C24/08C23C26/00H01L21/288H01L21/6715H01L21/76877H01L21/76882H01L23/53228H01L23/53238H01L23/5328H01L2924/0002C23C4/123B22F1/0545B22F1/052B22F1/102B22F1/054B22F1/10H01L2924/00H01L21/20
Inventor FUKUNAGA, AKIRANAGASAWA, HIROSHIKATO, TAKAO
Owner EBARA CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products