Line level air gaps
a microelectronic and integrated circuit technology, applied in the direction of electrical equipment, semiconductor devices, semiconductor/solid-state device details, etc., can solve the problems of increased intra-level interaction, increased energy consumption, and increased ic risk at line level, and achieve the effect of robust mechanical stability and the biggest impact on rc delay
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[0021]FIG. 1A shows the initial fabrication steps on the top surface of a semiconductor substrate (not shown) of an IC structure of the present invention. The first layer of a solid permanent ultra-low-K dielectric material 1 has been deposited on the substrate for patterning of the first via level. Examples of suitable porous and substantially non-porous gas permeable materials used to function as the solid permanent low-K dielectric at via levels include: porous SiLK and SiLK, a polymer product of Dow Chemical Company, which is applied as a spin-coated oligomeric solution and cured at about 400° C.-450° C.; porous SiCOH and SiCOH, a glassy spin-on material such as JSR, a product of JSR Micro; and methyl silsesquioxane (MSSQ). A first gas impermeable etch stop layer 2 has been deposited on the layer of permanent dielectric material 1 by means known in the art, such as spin-on, chemical vapor deposition (CVD) and the like. Examples of suitable materials used to function as the etch ...
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