Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Thyristor phase-selecting switch experiment device

A test device and phase selection switch technology, which is applied in the direction of measuring devices, electronic switches, instruments, etc., can solve the problems of inability to realize arbitrary opening angles and output waveforms, and achieve the effect of light weight, powerful functions, and intuitive operation

Active Publication Date: 2010-10-06
SHANGHAI ELECTRICAL APPLIANCES RES INSTGROUP
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Traditional mechanical switches cannot control any opening angle and output waveform

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Thyristor phase-selecting switch experiment device
  • Thyristor phase-selecting switch experiment device
  • Thyristor phase-selecting switch experiment device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] refer to figure 1 , which is an overall block diagram of the hardware of the thyristor phase-selection switch testing device of the present invention.

[0028] As shown in the figure, the load includes main CPU (1), input and output signal acquisition circuit (2), switching power supply (3), input and output interface (4), touch screen communication (5), host computer communication (6), CPLD signal processing circuit (7), thyristor trigger circuit (8), power circuit (9), thyristor (10); its electrical signal transmission relationship is: thyristor trigger circuit (8) triggers thyristor (10), and transmits the signal to The input signal acquisition circuit (2), after being processed by the main CPU (1), is respectively connected to the touch screen communication (5), the upper computer communication (6) and the input and output interface (4), the CPLD signal processing circuit (7), and the switching power supply ( 3) Supply power to the main CPU (1), the thyristor (10) ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a thyristor phase switch testing device, the comprehensive microprocessor and thyristor technique are used in the device; the projection angle of switch is operated by the drive pulse phase of the thyristor. The device includes: host CPU, acquisition circuit of input-output signal, switch power supply, input-output interface, touching screen communication, upper machine communication, CPLD signal processing circuit, thyristor trigger circuit, power return circuit and thyristor; the electrical signal transitive relation is: the thyristor trigger circuit triggers the thyristor, the signal is transmitted to the acquisition circuit, processed by the host CPU, and separately transmitted to the touching screen communication, the upper machine communication and the input-output interface, the CPLD signal processing circuit and switch power supply provide power for the host CPU, thyristor and power return circuit, and the signal is output.

Description

technical field [0001] The invention relates to a thyristor phase selection device test device, which belongs to the technical field of electrical inspection. Background technique [0002] The thyristor phase-selection switch test device controls the input angle of the switch by controlling the trigger pulse phase of the thyristor, so as to meet the current and voltage waveform requirements required by the detection equipment. [0003] At present, the main technology used in testing equipment is through mechanical switches, which are realized by manual operation. Traditional mechanical switches cannot control any opening angle and output waveform. For example, it is used in the thyristor phase-selection switch device of Shanghai Equipment Testing Center, a subsidiary of Shanghai Electric Appliance Research Institute (Group) Co., Ltd. [0004] With the advancement of technology, traditional detection equipment will be operated less and less manually, and will be gradually r...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00H03K17/00
Inventor 徐方荣阮于东应成
Owner SHANGHAI ELECTRICAL APPLIANCES RES INSTGROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products