Vertical double diffusion metal oxide semiconductor power device
An oxide semiconductor, vertical double diffusion technology, applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve the problem that the ability to resist radiation cannot be fully improved, the ability to resist single particle radiation is weakened, and the surface utilization of silicon wafers is not good. For advanced problems, the effect of increasing the single event failure threshold, improving the anti-radiation ability, and improving the anti-transient irradiation ability
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[0050] By adopting the partially buried oxygen structure of the present invention, a radiation-resistant, high-voltage, high-speed power device with excellent performance can be obtained. It can be applied to common power devices such as double diffused field effect transistors, insulated gate bipolar power transistors, static induced transistors, and PN diodes. Devices with a partially buried oxygen structure can be used in aerospace, nuclear environment, and other fields that require higher device resistance to radiation. With the development of semiconductor technology, more radiation-resistant, high-voltage, and high-speed power devices can be manufactured by using the present invention.
[0051] Introduce a new type of vertical DMOS power device with a partially buried oxygen structure, such as figure 2 Shown, including drain 1, n + (Or p + ) Substrate area 2, n - (Or p - ) Epitaxial layer 3, p (or n) region 5, n + (Or p + ) District 6, p + (Or n + ) District 7, source 8, ga...
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