Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Surface processing and forming method of photoresist layer

A technology of photoresist layer and photoresist, which is applied in the direction of photosensitive material processing, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems of film layer pattern distortion, contour distortion, and resolution reduction, etc. achieve the effect of avoiding deformation

Active Publication Date: 2006-08-16
UNITED MICROELECTRONICS CORP
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Depend on figure 1 It can be seen that the profile of the patterned photoresist layer is distorted due to the relatively narrow width, which will make the film to be etched when the photoresist layer is used as a mask for the subsequent etching process Layers that distort the pattern or cause resolution loss

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Surface processing and forming method of photoresist layer
  • Surface processing and forming method of photoresist layer
  • Surface processing and forming method of photoresist layer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] Since the patterned photoresist layer obtained by the photolithography process tends to be deformed or collapsed when the line width becomes larger and larger, the present invention proposes a surface of the photoresist layer approach to deal with the above problems. The surface treatment method of this photoresist layer is to use photolithographic equipment to form a patterned photoresist layer on the wafer, and then move the wafer to the etching reaction, using at least hydrogen bromide or iodine A reaction gas of hydrogen hydride is used to perform a surface treatment step on the photoresist layer to form a hardened layer on the surface of the photoresist layer.

[0032] The above surface treatment step uses radio frequency voltage to excite the reactive gas into plasma to form a hardened layer on the surface of the photoresist layer, and the hardened layer can effectively maintain the profile of the patterned photoresist layer. In addition, the material of the abov...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A surface processing method of photo resist layer utilizes reaction gas containing hydrogen bromide or hydrogen iodide to carry out a surface treatment on photo resist layer after patternized photo resist layer is formed on chip in order to prepare a hardened layer on surface of photo resist layer .The said surface treatment process is carried out simultaneously with etching process.

Description

technical field [0001] The invention relates to a semiconductor manufacturing process, in particular to a surface treatment method of a photoresist layer and a method for forming a patterned photoresist layer using the aforementioned surface treatment method. Background technique [0002] In the case of higher and higher circuit integration requirements, the design of the size of the entire circuit element is also forced to advance in the direction of continuous reduction in size. At present, the semiconductor process has entered the 90-nanometer process. The most important step in the entire semiconductor process is the photolithography process. The decision of any critical dimension is dominated by the photolithography step. [0003] However, in the photolithography process, the patterned photoresist layer is formed by exposing and developing the photoresist layer. The relatively narrow width of the photoresist layer makes it difficult to maintain the profile of the photo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G03F7/26
Inventor 黄国书
Owner UNITED MICROELECTRONICS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products