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Intelligent card chip with microprocessor capable of making automatic test

A smart card chip and microprocessor technology, applied in the detection of faulty computer hardware, logical operation inspection, etc., can solve the problems of long test time, affecting delivery time, and increasing production costs

Inactive Publication Date: 2004-10-13
上海华园微电子技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The test equipment is expensive and the test time is long
Increase production costs and affect lead times

Method used

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  • Intelligent card chip with microprocessor capable of making automatic test
  • Intelligent card chip with microprocessor capable of making automatic test
  • Intelligent card chip with microprocessor capable of making automatic test

Examples

Experimental program
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Embodiment Construction

[0017] Such as figure 2 Shown: a self-testable smart card chip with a microprocessor provided in this embodiment is provided with a self-test circuit, which can test the main circuit 1 in the smart card chip, i.e. CPU11, ROM12, RAM13 , EEPROM14, and encryption algorithm coprocessor 15 are fully tested, and the self-test circuit includes a multi-way switch 3 that sends the normal working data or test commands input from the input serial port 2 to the main circuit 1 according to the state of the external test mode signal . A test pattern generator (TPG) 4 that controls the generation of test data according to the test instructions from the multi-way switch 3, a feature analysis that compresses the test result data and analyzes the test result and outputs the test result from the output serial port 6 Device (SA) 5. In this embodiment, the input serial port 2 and the output serial port 6 are 7816 or USB serial ports.

[0018] Such as image 3 As shown: the multi-way switch 3 ...

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Abstract

The invention provides a self-testing intelligent chip with microprocessor, including a main circuit and a self-testing circuit bidirectionally connected with the main circuit and able to make complete test on the main circuit, where the self-testing circuit includes: a testing mode input end, a multichannel switch to identify normal working data input or test data input, a testing figure generator controlled by testing command and mode, and a property analyzer to analyze if testing result is correct and failure type, where the testing figure generator produces a testing data for testing each module of the main circuit or the synthetic function of the modules. Thus, it is basically unnecessary for the user to connect external testing device in order to test and verify the intelligent chip.

Description

technical field [0001] The invention relates to an intelligent card chip with a microprocessor, in particular to a self-testing intelligent card chip with a microprocessor. Background technique [0002] Smart cards with integrated circuits are rapidly popularized and developed in various fields of the national economy. A smart card with a CPU is the most important type of smart card. It is widely used in various fields such as finance, communication, social security, transportation, payment, and identity management. [0003] Due to the particularity of smart card applications, there are particularly high requirements for security and reliability. If defective chips due to various factors such as design, manufacturing, and craftsmanship are not detected and enter the hands of users, it will cause great harm. harm. Therefore, for the smart card chip with CPU, a comprehensive and detailed test must be carried out for each chip. [0004] The smart card chip with CPU includes...

Claims

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Application Information

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IPC IPC(8): G06F11/25
Inventor 印义中印义言郭俊黄激卢君明
Owner 上海华园微电子技术有限公司
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