Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Bonding jitter automatically testing method and system

An automatic test system and automatic test technology, applied in the direction of measuring devices, instruments, etc., can solve the problems of inability to realize PDH branch boards, large manpower consumption, etc.

Inactive Publication Date: 2004-08-18
SHANGHAI HUAWEI TECH CO LTD
View PDF0 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0024] The technical problem to be solved by the present invention is: to overcome the shortage of the existing combined jitter test that consumes a lot of manpower and cannot realize the automatic test of multiple ports of the PDH tributary board, and provide a method and system for combined jitter automatic test, which not only reduces the testing cost Manual consumption, and automatic selection of multiple PDH signals can be realized, thereby saving test time and improving test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Bonding jitter automatically testing method and system
  • Bonding jitter automatically testing method and system
  • Bonding jitter automatically testing method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] Below according to accompanying drawing and embodiment the present invention will be described in further detail:

[0063] The present invention adopts the control device to control the SDH analyzer (such as the OmniBER series SDH analyzer of Agilent Company), and will select the pointer sequence, change the frequency offset, and record the test data. The test results; and use the port selection board to realize the automatic selection of multi-channel PDH signals, and can continuously test multiple PDH branch output ports. After each port is tested, it will automatically switch to the next port to start testing until all signals are tested. User pre-specified port.

[0064] Such as figure 2 Shown is the connection schematic diagram of the present invention combined with the jitter automatic test, the test signal is sent by the SDH analyzer, a control device is connected to the SDH analyzer and the port selection board through two RS232 serial interface lines, and the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a joint shake automatic testing method for synchronized digital hierarchy (SDH) device, wherein the control equipment sends the user selected testing parameters to the SDH analyzer, and proceeds relevant arrangement to the SDH analyzer, the SDH analyzer performs test to the tested equipment in sequence under different pointer sequence, shake electric wave filter or dissimilar frequency deviation of pseudo-random bit sequence bit ratio, and feeds back the testing data to the control equipment, which then creates and maintains the testing result.

Description

technical field [0001] The invention relates to the test of transmission data, in particular to a test method and system for SDH (Synchronous Digital Hierarchy) equipment combined with jitter. Background technique [0002] The combined jitter of SDH (Synchronous Digital Hierarchy) equipment is the jitter generated by the PDH (Pseudo-Synchronous Digital Hierarchy) branch output port on the demultiplexing side of the equipment under the combination of branch mapping and pointer adjustment. Combined jitter is an indicator of SDH equipment. The traditional test method for this indicator is manual, which takes a long time and consumes a lot of manpower. [0003] Such as figure 1 The schematic diagram of the traditional combined jitter test connection is shown. The combined jitter test is completed with an SDH analyzer. The SDH analyzer sends out a test signal and measures the jitter at the output port of the PDH branch. The test method is as follows: [0004] 1) According to th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01D21/00
Inventor 张俊岭边英杰张立骞
Owner SHANGHAI HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com