Wiring design device and method for integrated circuit

A wiring design, integrated circuit technology, applied in circuits, computer-aided design, computing, etc., can solve the problems of limited wiring freedom, long chip design time, increased memory usage, etc., to reduce memory usage, shorten the Design time, the effect of increasing degrees of freedom

Inactive Publication Date: 2004-05-12
KK TOSHIBA
View PDF1 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, 1) In the method of uniformly wiring the entire chip, since the wiring connection information of the entire chip is processed at the same time, the amount of memory usage increases and the processing time becomes longer.
Therefore, when the scale of the integrated circuit is large, there are problems of inability to layout and long design time due to insufficient memory.
[0007] On the other hand, 2) In the hierarchical layout method, since the necessary memory usage can be limited, the problem of the memory usage when performing unified wiring is solved, but since the logic module area is set as a wiring-prohibited area, the limitation The degree of freedom of wiring is increased, and the chip area becomes larger as a result
In addition, since each module is processed independently, it is difficult to meet the timing constraints of the wiring across the modules and the processing antenna constraints caused by the influence of the charge accumulated between the wiring layers generated in the device manufacturing process at the design stage. Chip design time tends to be long

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wiring design device and method for integrated circuit
  • Wiring design device and method for integrated circuit
  • Wiring design device and method for integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] figure 1 is a configuration diagram of a semiconductor design device according to Embodiment 1 of the present invention.

[0027] LSI design has multiple stages, and the semiconductor design device described here corresponds to a CAD tool for automatic wiring for wiring between logic cells arranged on a chip. In addition, not only wiring but also layout design of logic cells and the like can be performed.

[0028] like figure 1 As shown, the semiconductor design device of the first embodiment has a storage unit 10 having at least a plurality of storage areas 11, 12, 13, etc., and a CPU 20 equivalent to a computer. In addition, as shown in the figure, it is preferable to have a plurality of CPUs because the wiring processing can be processed in parallel. In addition, the input unit 31 and the output unit 32 are provided integrally or as external peripheral devices.

[0029] The storage unit 10 has a plurality of memories 11 to 13, and stores, for example, a program, ...

Embodiment 2

[0058] The wiring design method of the second embodiment is a modified example of the first embodiment. That is, in Embodiment 1, the wiring design method of dividing the wiring between logic cells into the first group and the second group was described by taking 6 wiring layers as an example, but in Embodiment 2, when using 9 wiring layers, the logic Inter-unit wiring is divided into three groups of 1st to 3rd wiring design method.

[0059] In addition, since the structure and design method of the basic design device are the same as those of Embodiment 1, refer to Figure 7 ~ Figure 10 Example 2 will be briefly described.

[0060] First, the logical unit configuration information is obtained (S210), and based on this information, the wiring length of each wiring is calculated, and the wiring whose expected wiring length is less than the reference wiring length is used as the first group, and the wiring that is larger than the reference wiring length and less than twice As t...

Embodiment 3

[0068] The wiring design method of the third embodiment adopts a method different from that of the first and second embodiments for grouping the wiring between logic units.

[0069] In addition, the structure of the basic wiring design device has the same figure 1 The configuration of the wiring design device of the first embodiment shown is substantially the same, but the number of CPUs is the number corresponding to the number of groups.

[0070] Below, refer to Figure 11 The flow chart shown illustrates the wiring design method of Embodiment 3. In addition, the number of wiring layers formed on the semiconductor chip is not limited, but a case of a 6-layer wiring LSI will be described as an example.

[0071] First, logical cell arrangement information such as positions between cell terminals and a wiring connection list between terminals is acquired (S310).

[0072] Next, divide the chip plane into a plurality of areas at the grid-like boundary, divide the wiring betwee...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An apparatus executes wire layout design in an integrated circuit. The apparatus includes a logic cell arrangement information acquisition unit which acquires information concerning a logic cell arrangement on a chip, a wire-grouping unit which estimates wires between logic cell terminals based on the acquired information and groups the estimated wires into each wire layer region, a via setting unit which sets via wire for pulling a logic cell terminal up to a wire layer region, a wire information extraction unit which extracts wire information for each of the wire groups and a routing execution unit which executes routing between the logic cell terminals for each of the wire layer regions based on the extracted information. A method for executing wire layout design in an integrated circuit includes acquiring information concerning a logic cell arrangement on a chip, executing wire-grouping, setting via wire for pulling a logic cell terminal up to a wire layer region, extracting wire information for each of the wire groups, and executing routing between the logic cell terminals for each of the wire layer regions based on the extracted information. The wire-grouping contains estimating wires between logic cell terminals based on the acquired information concerning the logic cell arrangement and dividing the estimated wires into each group of a wire layer region.

Description

[0001] This application is based upon and claims the benefit of priority from prior Japanese Patent Application No. 2002-138399 filed on May 14, 2002, the entire contents of which are incorporated herein by reference. technical field [0002] The present invention relates to semiconductor integrated circuit design, and in particular to a semiconductor integrated circuit design device, a semiconductor integrated circuit design method, and a semiconductor integrated circuit design program used in the wiring layout design process between logic cells. Background technique [0003] The layout design process, which is an important process in system LSI design, requires the use of wiring connection information obtained from logic design and a logic cell library prepared through circuit design to configure logic gates and automatically route wiring to make the chip area as small as possible. [0004] In recent years, with the increase in the scale of integrated circuits, the informat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50H01L21/82
CPCG06F17/5077G06F30/394H01L21/00
Inventor 改田博政
Owner KK TOSHIBA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products