Method for preparing probe tip of nano tube

A probe tip and nanotube technology, which is applied in the field of nanotube probe tip preparation, can solve the problems of low efficiency, uncontrollable growth point position and size, etc., and achieves the effects of simple equipment, convenient operation and improved resolution.

Inactive Publication Date: 2005-12-21
SOUTHEAST UNIV
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Problems solved by technology

The advantage of this method is that it is easy to operate, but because the position and size of the growth point cannot be controlled, and the growth direction is also random, the carbon tube tip prepared is easy to form multiple needle points, so the efficiency of this preparation method is very low

Method used

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  • Method for preparing probe tip of nano tube
  • Method for preparing probe tip of nano tube
  • Method for preparing probe tip of nano tube

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Effect test

preparation example Construction

[0024] The method for preparing the tip of a nanotube probe of the present invention includes the following steps:

[0025] (1) Modify the hydrophobic monolayer film on the surface of the probe tip,

[0026] (2) The hydrophobic monolayer film at the tip of the needle tip is removed or oxidized into a hydrophilic film by a pulsed electric field,

[0027] (3) Calculate the size of the activated area by detecting the effect of the needle tip applied by the electric field on the surface of the standard sample through the scanning probe microscope,

[0028] (4) The hydrophilic zone at the tip of the needle absorbs catalyst droplets to fix the catalyst particles,

[0029] (5) Place the needle tip loaded with catalyst nanoparticles in the nanotube reactor to grow nanotubes.

[0030] The probe tip may be a tip made of a silicon semiconductor material, or a silicon tip that has been coated with a metal or non-metal coating film or a compound coating film.

[0031] The hydrophobic monolayer...

Embodiment

[0039] Implementation example, needle tip hydrophobization treatment: the clean silicon needle tip was immersed in a benzene solution of 0.1% (volume ratio) octadecyltrichlorosilane for 26 hours, then taken out, immersed in chloroform and ethanol in turn, and then dried with nitrogen. Selective activation of the hydrophobic monolayer film of the silicon needle tip: control the distance between the needle tip of the hydrophobic film and the gold film sample, and apply a pulse voltage such as 0.4 volts for 100 milliseconds to complete the activation. Fixation of catalyst particles: immerse the activated needle tip in a 0.5 molar ferric nitrate solution, take it out and dry it in a drying oven at 110°C for 2 hours. Growing carbon nanotubes: Put the needle tip fixed with the catalyst into the furnace and pass 0.5 L / min of ethylene gas, and grow it at 750 degrees Celsius for 30 minutes.

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Abstract

The method for preparing the tip of the nanotube probe is a method for preparing the tip suitable for various modes of the atomic force microscope. In this method, a hydrophobic monolayer film is firstly modified on the surface of various silicon probe tips, and then the hydrophobic film at the tip of the tip is removed or oxidized into a hydrophilic film by an electric field, and the tip on which the electric field has been applied is detected by a scanning probe microscope. The size of the activation area is calculated by the effect on the surface of the standard sample, and then the catalyst particles are fixed on the hydrophilic area on the surface of the needle tip, and finally the needle tip loaded with catalyst nanoparticles is placed in the nanotube reactor to grow nanotubes. The method of the invention not only requires simple equipment and is convenient to operate, but also can grow single, single-wall nanometer carbon tubes with high efficiency, and is suitable for commercial industrial production.

Description

1. Technical Field [0001] The invention relates to a method for preparing a nanotube probe tip, which belongs to the technical field of nanodevice manufacturing. 2. Background technology [0002] The atomic force microscope can detect the shape of atoms and molecules with high resolution, and determine the electrical, magnetic and mechanical properties of the surface of the object. It is becoming the field of physics, chemistry, biology, microelectronics and materials science for microstructure detection and nanoscale processing. Of conventional tools. The probe tip is a key part of the atomic force microscope, which directly determines the resolution of the microscope and affects the various uses of the microscope. Scanning probes are usually prepared from semiconductor materials through sputtering deposition, etching and other processing procedures. The semiconductor materials used include silicon nitride and various doped single crystal silicon. The probe is composed of a micr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/38
Inventor 肖忠党巴龙蔡承志陆祖宏
Owner SOUTHEAST UNIV
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