Static frequency-measuring method and device for classifying piezoelectric ceramic chiops and devices

Abstract

A static frequency measuring method for classifying piezoelectric ceramic chips and devices features that said chips or devices are conveyed on an electromagnetically vibrating channel, a pair of movable electrodes are in contact with the both surface of chip or device at measuring position while a measuring frequency is applied to it, the oscillation signal generated by the chip or device is received, and the chips or device are classified by controller according to said signals. Its advantages are correct positioning and software control.

Description

(1) Technical field [0001] The invention relates to a kind of testing and sorting of piezoelectric ceramic sheets and resonators, filters, frequency discriminators, oscillators and other devices packaged with piezoelectric ceramic sheets, especially for sorting by static frequency measurement. Methods and Apparatus. (2) Background technology [0002] Piezoelectric ceramic sheets are the most widely used ceramic materials in the world. Electronic devices packaged with ceramic sheets, such as resonators and filters, are extremely versatile devices, and these devices have high stability. Ceramic sheets are the basis for making piezoelectric ceramic devices. In the process of production and processing, it is necessary to detect and classify the parameters of ceramic chips such as natural frequency, resonance resistance, electrostatic capacity, bandwidth, etc. Of course, it is also necessary to sort the manufactured ceramic devices. Therefore, the automatic sorting device for ...

AI Technical Summary

Problems solved by technology

At present, the frequency measurement method for piezoelectric ceramic sheets and devices is mainly manual frequency measurement with fixtures. This method is inefficient and the quality cannot be guaranteed.

The existing testing and sorting methods for quartz wafers and devices cannot be simply transferred to the static frequency measurement and sorting of ceramic chips and devices, because the testing of quartz wafers is non-contact, and the measurement is carried out in the resonant cavity. The static frequency measurement and sorting of ceramic sheets and devices should be electrical contact

[0003] There are also equipment for frequency measurement and sorting of piezoelectric ceramic sheets and devices abroad, but its mechanical structure is complex, energy consumption is high, noise is large, maintenance is very inconvenient, and the price is very expensive

In addition, this kind of equipment is transferred many times during the measurement process, which may easily cause damage to the tiles. The whole set of mechanical linkages is constrained by factors such as mechanical friction and motion rigidity, and the sorting speed is limited.

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