Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

SITEMAP graph adding method

A MAP map, one-to-one correspondence technology, applied in the field of wafer testing, can solve problems such as long time-consuming and error-prone, and achieve the effect of less error-prone, fast and accurate statistics

Pending Publication Date: 2022-05-27
上海利扬创芯片测试有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This means that when counting a batch of data, it is first necessary to export the actual test map from the MES system, and then open the SITE MAP map for manual comparison, which takes too long and is prone to errors
The root cause is that, taking the prober as an example, the files generated by the TEL type prober do not have SITE MAP information, and can only be counted manually

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • SITEMAP graph adding method
  • SITEMAP graph adding method
  • SITEMAP graph adding method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] In order to make the purposes, technical solutions, and advantages of the embodiments of the present invention clearer, the following will be combined with the appendixes in the embodiments of the present invention. Figure 1 to Figure 5 , clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. The components of the embodiments of the invention generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations.

[0032] Thus, the following detailed description of the embodiments of the invention provided in the accompanying drawings are not intended to limit the scope of the invention as claimed, but are merely representative of selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtai...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for adding an SITE MAP graph. The method comprises the following steps: S100, importing an SITE MAP graph file; s200, a probe file is imported; and S300, according to the imported SITE MAP file and the probe file, the SITE MAP file and the probe file are compared, and after comparison, a new standard MAP file is generated. Compared with the prior art, the method has the advantages that the manual file comparison method in the prior art is abandoned, and compared with the prior art, the method is quicker and more convenient, is not easy to make mistakes, and is convenient for operators to quickly and accurately count.

Description

technical field [0001] The invention belongs to the field of wafer testing, and particularly relates to a method for adding a map to a SITE MAP. Background technique [0002] The main purpose of wafer testing is to not package the tested bad chips, thereby reducing packaging costs. In the field of wafer testing, the probe card (Probe card) is the medium between the wafer and the tester. The probe card is usually placed directly on the probe station prober and connected to the tester with wires. The purpose of the probe card is to provide the connection between the chip and the tester, and to complete the wafer test. A probe card is a custom connector with a common pattern, and it is usually necessary to provide targeted probe cards for different types of wafers. [0003] figure 1 It is a working schematic diagram of the wafer testing link in the prior art. During wafer testing, the SITE information of different types of probe cards is different, and the yields between d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F40/194G06F16/335G06T11/20G01R31/28H01L21/66
CPCG06F40/194G06F16/335G06T11/206H01L22/14G01R31/28
Inventor 朱思琴张钦祥陈聪
Owner 上海利扬创芯片测试有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com