Non-uniform correction coefficient storage method and system based on NandFlash

Abstract

The invention relates to the technical field of spaceflight, in particular to a NandFlash-based non-uniform correction coefficient storage method and a NandFlash-based non-uniform correction coefficient storage system. According to the method, the storage format of the correction coefficient in the NandFlash is planned firstly, the storage space is efficiently utilized, and the correction coefficient is stored in the NandFlash on the ground in advance; then, a bad block management table is developed in the FPGA by using an RAM (Random Access Memory) and corresponds to all storage spaces of a group of NandFlash, and a mapping relation between a logic address and a physical address of a block is established by using the bad block management table; after the camera is powered on in orbit, reading data of a NandFlash initial address to replace the bad block management table; and finally, exporting the correction coefficient in the NandFlash into a DDR3 (Double Data Rate 3) memory, and performing non-uniformity correction on the shot image.

Description

technical field [0001] The invention relates to the field of aerospace technology, in particular to a method for storing non-uniform correction coefficients based on NandFlash and a system thereof. Background technique [0002] In the past, the detectors of aerospace cameras mostly used linear array CCDs, and the number of pixels that needed on-orbit correction was small, or for area array CMOS that only corrected pixels in the column direction, only a small amount of storage space was needed to store the correction coefficients, so , the internal memory resources of the FPGA are often used to store the correction coefficients, but this cannot meet the current large area array CMOS correction coefficient storage requirements. [0003] In recent years, scientific-grade CMOS imaging sensors have occupied a dominant position in space exploration tasks such as earth surveying, remote sensing imaging, and star sensors, and have gradually replaced CCD imaging by virtue of their hi...

AI Technical Summary

Problems solved by technology

[0004] Compared with the linear array CCD, the area array CMOS has simple driving circuit, high integration and high reliability. However, due to the structural characteristics of the CMOS detector, each pixel in the area array has an independent gain amplifier, so the imaging result There is non-uniformity, in order to achieve good imaging effect, it is necessary to perform non-uniformity correction for each pixel

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