System and method for testing performance indexes of avalanche photodiode in Geiger mode

Abstract

The invention belongs to the technical field of diode performance index testing, and particularly discloses a Geiger-mode avalanche photodiode performance index testing system and a Geiger-mode avalanche photodiode performance index testing method. The system comprises a control module, a signal synchronization module, a light source module, a data processing module and a module to be tested. The method comprises the following steps of: installing a to-be-tested avalanche photodiode on a to-be-tested circuit, and connecting a peak noise balancer which is connected with the to-be-tested avalanche photodiode in parallel to simulate and generate a signal which is the same as peak noise of the to-be-tested avalanche photodiode so as to effectively extract an avalanche photodiode signal; then testing a dark count value of the avalanche photodiode to be tested when no signal light is received, an effective count value in a gating of the avalanche photodiode to be tested when the signal light is received and a post-pulse count value in the gating of the avalanche photodiode to be tested when the signal light is not received, and calculating the detection efficiency, the dark count rate, the post-pulse probability and the time jitter index of the avalanche photodiode to be tested. The test method is simple to operate and easy to implement, and test results are high in repeatability.

Description

technical field [0001] The invention belongs to the technical field of diode performance index testing, and more specifically relates to a Geiger-mode avalanche photodiode performance index testing system and method. Background technique [0002] The avalanche photodiode working in the Geiger mode can reach the single photon level of sensitivity, and has been more and more widely used in the field of laser imaging and ranging in recent years. The detection probability, dark count rate, post-pulse probability and time jitter of the Geiger mode avalanche photodiode directly affect the detection distance and accuracy of laser imaging and ranging. In order to test more accurately the laser imaging and ranging system The performance index of the avalanche photodiode, the present invention proposes a test device and method that can effectively test the performance index of the Geiger mode avalanche photodiode, which is of great significance for evaluating the performance of the la...

AI Technical Summary

Problems solved by technology

[0003] At present, the avalanche photodiode Geiger mode performance index test device at home and abroad has complex circuit design and high cost. The test circuit and calibration method can maximize the elimination of circuit noise, and the test results given can maximize the best state of the avalanche photodiode itself. Inconsistent with the echo energy and circuit state received by the avalanche photodiode in actual use

Chinese patent CN106197692A discloses "a testing device and testing method for a single photon detector". The drive module, coincidence delay module, coincidence counting module and anti-coincidence counting module have complex circuit functions and high design difficulty, and the key technology design principles of the circuit are not given, and the operation is difficult. The applicable field is mainly quantum communication, and it is not suitable for Universal Test System

The Chinese patent discloses "a single-photon avalanche photodiode calibration system and calibration method", which mainly provides the avalanche photodiode calibration method. The calibration circuit has a large deviation from the actual circuit state of the avalanche photodiode, which is not enough to reflect the actual use of the avalanche photodiode. status performance

That is, the existing avalanche photodiode Geiger mode performance index test device has complex circuit design and high cost. The test circuit and calibration method can maximize the elimination of circuit noise, and the test results given can maximize the best state of the avalanche photodiode itself. , inconsistent with the echo energy and circuit state received by the avalanche photodiode in actual use

[0004] Based on the above-mentioned defects and deficiencies, there is an urgent need to propose a new Geiger mode avalanche photodiode performance index test system in this field to solve the problem that the current test device circuit is complicated and cannot reflect the Geiger mode used in the laser imaging and ranging system. Avalanche photodiode performance and other issues, and can perform avalanche photodiode detection probability, dark count rate, post-pulse probability and time jitter performance index tests under the condition of receiving single photon energy or different echo energies

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