High-efficiency fixing device for semiconductor material four-probe measuring instrument

Abstract

The invention provides a high-efficiency fixing device for a semiconductor material four-probe measuring instrument, and relates to the technical field of new electronic materials. The high-efficiency fixing device for the semiconductor material four-probe measuring instrument comprises a base, a positioning mechanism is installed at the top of the base, the positioning mechanism comprises a positioning disc, and a suction plate is fixedly connected to the side, away from an electromagnet, of an adjusting bag. According to the high-efficiency fixing device for the semiconductor material four-probe measuring instrument, the electromagnet is electrified to generate magnetic force to drive the suction plate to slide, the suction plate extrudes the adjusting bag, the adjusting bag enables air pressure in a top bag to be increased through an air pipe, thrust of the top bag to an air valve is increased, and the air valve enables clamping force of an ejector block to be increased; the current of the electromagnet is controlled, therefore, the magnetic force of the electromagnet is controlled, and the clamping force is controlled; and through cooperative use of the ejector block and a stop switch, the effects that the clamping force can be adjusted according to materials, and the intelligent degree is high are achieved.

Description

technical field [0001] The invention relates to the technical field of new electronic materials, in particular to a high-efficiency fixing device for a four-probe tester for semiconductor materials. Background technique [0002] New electronic materials refer to a class of materials with functional properties such as energy and signal emission, absorption, conversion, transmission, storage, display or processing, including conductive materials, semiconductor materials, magnetic materials, optoelectronic materials, new energy materials, etc., among which A type of electronic material whose electrical conductivity is between that of a conductor and an insulator, and whose electrical conductivity changes significantly with changes in the environment. The use of semiconductor materials requires a four-probe tester to test the resistivity and sheet resistance. The existing The fixing device of the four-probe tester can only fix a single semiconductor material. After the test is c...

AI Technical Summary

Problems solved by technology

[0002] New electronic materials refer to a class of materials with functional properties such as energy and signal emission, absorption, conversion, transmission, storage, display or processing, including conductive materials, semiconductor materials, magnetic materials, optoelectronic materials, new energy materials, etc., among which A type of electronic material whose electrical conductivity is between that of a conductor and an insulator, and whose electrical conductivity changes significantly with changes in the environment. The use of semiconductor materials requires a four-probe tester to test the resistivity and sheet resistance. The existing The fixing device of the four-probe tester can only fix a single semiconductor material. After the test is completed, the material needs to be removed and then another material is fixed. The detection efficiency is low. At the same time, some materials are small and have irregular surfaces, which are difficult and easy to fix. Crush the material, resulting in material waste

[0003] Aiming at the deficiencies of the prior art, the present invention provides a high-efficiency semiconductor material four-probe tester fixing device, which can automatically fix and take out the material, has high detection efficiency, and can be applied to materials of different shapes and sizes. The advantages of adjusting the clamping force of the material and high degree of intelligence solve the problem that the existing four-probe tester's fixing device can only fix a single semiconductor material. After the test is completed, the material needs to be removed, and then another material is fixed, which improves the detection efficiency. Low, at the same time, some materials are small and irregular in surface, difficult to fix, and easy to crush the material, resulting in material waste

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