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Analog-to-digital converter and calibration method thereof

A technology for analog-to-digital converters and calibration methods, applied in the directions of analog-to-digital converters, analog/digital conversion calibration/testing, analog/digital conversion, etc., can solve problems such as ADC performance degradation and capacitance mismatch, and improve accuracy , Eliminate the effect of input offset voltage

Active Publication Date: 2021-12-07
杭州深谙微电子科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, due to the production process of the capacitor array SAR ADC, there is a problem of capacitor mismatch, which leads to the degradation of ADC performance.

Method used

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  • Analog-to-digital converter and calibration method thereof
  • Analog-to-digital converter and calibration method thereof
  • Analog-to-digital converter and calibration method thereof

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Embodiment Construction

[0033] Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. In the various figures, identical elements are indicated with similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale. Also, some well-known parts may not be shown in the drawings.

[0034] In the following, many specific details of the present invention are described, such as structures, materials, dimensions, processes and techniques of components, for a clearer understanding of the present invention. However, the invention may be practiced without these specific details, as will be understood by those skilled in the art.

[0035] It should be understood that in the following description, "circuitry" may include single or multiple combined hardware circuits, programmable circuits, state machine circuits and / or elements capable of storing instructions for execution by programmable circuits. When an e...

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Abstract

The invention discloses an analog-to-digital converter and a calibration method thereof. The calibration method comprises the steps that a first calibration value is obtained through a first calibration process, a second calibration value is obtained through a second calibration process, and then calibration parameters of the calibration capacitor array are determined according to the first calibration value and the second calibration value. The first calibration process and the second calibration process need to switch the potentials connected with the lowest-order capacitor of the high-order capacitor array and all the capacitors of the low-order capacitor array in the charge sampling stage and the charge holding stage; the difference is that the potential switching directions of the first calibration process and the second calibration process are opposite; through opposite potential switching, the obtained calibration parameter is not influenced by the input offset voltage of the comparator, so that the influence of the input offset voltage of the comparator in the calibration process can be effectively eliminated in the calibration process, and the calibration accuracy is improved.

Description

technical field [0001] The present invention relates to the technical field of semiconductor integrated circuits, and more particularly relates to an analog-to-digital converter and a calibration method thereof. Background technique [0002] Analog to Digital Converter (Analog to Digital Converter, ADC) is a device that can convert continuous analog signals into discrete digital signals that can be processed by computers. It is a key component of the interface between analog systems and digital systems. It has long been widely used It is used in radar, communication, measurement and control, medical treatment, instrumentation, image and audio and other fields. With the rapid development of digital signal processing technology and communication industry, ADC is gradually developing in the direction of high speed, high precision and low power consumption. [0003] The successive approximation analog-to-digital converter (Successive Approximation Register ADC, SAR ADC) uses th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10H03M1/46H03M1/12
CPCH03M1/1009H03M1/466H03M1/1245
Inventor 许鹏
Owner 杭州深谙微电子科技有限公司
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