Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Image damage detection method, electronic equipment and storage medium

A damage detection and damage technology, applied in the field of image processing, can solve problems such as difficult to ensure the accuracy of the defect area, complex image structure and content, and difficult to detect the defect area

Active Publication Date: 2021-12-03
SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the detection of the damaged area in the image is one of the key steps to repair the image. The repair of the damaged image needs to identify and mark the damaged area and the known area of ​​the image, and then analyze and fill the damaged area. The defect manifestations of the image are diverse and uncertain, and the structural content of some images is complex, which makes it difficult to detect all defect areas in the image with a single method, making it difficult to ensure the accuracy of defect area detection in the image

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image damage detection method, electronic equipment and storage medium
  • Image damage detection method, electronic equipment and storage medium
  • Image damage detection method, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0063] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary, and are only for explaining the present application, and should not be construed as limiting the present application.

[0064] In the description of this application, reference to the terms "one embodiment," "some embodiments," "exemplary embodiments," "example," "specific examples," or "some examples" is intended to mean that the embodiments Specific features, structures, materials, or characteristics described in or examples are included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an image damage detection method, electronic equipment and a storage medium. The method comprises the following steps: acquiring a to-be-detected real damaged image, acquiring a preset damage type, processing the acquired real damaged image to obtain a first image damaged mask corresponding to the real damaged image, performing simulation processing on the real damaged image based on the preset damage type to obtain a second image damaged mask, and according to the first image damage mask and the second image damage mask, obtaining a target image damage mask, and obtaining all defect areas in the real damage image. Two detection methods are adopted, namely, the real damage image is detected, simulation detection is conducted on the real damage image, the first image damage mask and the second image damage mask are generated respectively, the detection data and the diversity of the detection data are increased, the detection accuracy of the defect area in the image can be improved, and then digital restoration of the real damage image is achieved.

Description

technical field [0001] The present application relates to the technical field of image processing, and in particular to an image damage detection method, electronic equipment and a storage medium. Background technique [0002] At present, people take improper preservation measures for some images, such as ancient paintings, which will lead to problems such as color degradation, tearing, peeling and cracking of the image. However, the traditional manual repair of images is time-consuming and irreversible. Based on Considering the above considerations, the image can be digitally restored to obtain a visual estimate of the original appearance of the image to help users restore the image or take appropriate preservation measures. Among them, the detection of the damaged area in the image is one of the key steps to repair the image. The repair of the damaged image needs to identify and mark the damaged area and the known area of ​​the image, and then analyze and fill the damaged ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G06N3/08
CPCG06T7/0002G06N3/08G06T2207/20081G06T2207/20084G06T5/77
Inventor 曾媛贡毅
Owner SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com