Distribution network fault studying and judging method and system based on sudden reduction degree of feeder current and probability density of the proportion of switch loads
A technology of probability density and feeder current, applied in the direction of fault location, measurement of electricity, measurement of electrical variables, etc., can solve the problems of high real-time and reliability requirements of the communication system, long time for fault research and judgment, etc., to ensure reliability and speed of research and judgment fast effect
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Embodiment 1
[0043] This embodiment discloses a distribution network fault research and judgment method based on feeder current sag degree and switch load proportion probability density.
[0044] After a fault occurs in the distribution network, because the fault current is greater than the setting value of the switch protection action on the line, the action and reclosing process of the line relay protection system will be triggered. After the selective action of the protection or the reclosing process, the upstream line switch closest to the fault point will trip and disconnect, and all distribution transformers and their loads downstream of the switch will be cut off, resulting in a sudden drop in power at the feeder outlet. Under the condition of ignoring the line loss, the percentage δ of the load dip at the outlet of the feeder is equal to the percentage λ of the load downstream of the trip switch to the load of the entire line. Therefore, if the percentage of the downstream load of ...
Embodiment 2
[0079] Corresponding to the above-mentioned embodiments, this embodiment discloses a distribution network fault research and judgment system based on the feeder current sag degree and the probability density of the switch load ratio, including a memory, a processor, and a memory stored in the memory and can be stored on the processor. A running computer program, the processor implements the corresponding steps of the above method when executing the computer program.
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