Test system and method
A test system and test device technology, applied in the direction of test/monitoring control system, general control system, electrical test/monitoring, etc., can solve the problems of high cost of testing equipment, inaccurate test results, inconvenient use, etc., and achieve simple wiring, Reduced weight and ease of use
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[0062] The principles and features of the present invention will be described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.
[0063] like figure 1 As shown, a test system provided by an embodiment of the present invention includes: test master station software 109 and test device hardware;
[0064] The test device hardware specifically includes: Ethernet communication module group, analog output module 106, analog output module 107, switch input module 104, switch output module 105, CPU module 102 and FPGA module 101; wherein, the Ethernet communication module The group includes: a first Ethernet communication module 1031 and a second Ethernet communication module 1032;
[0065] FPGA module 101 is connected with analog quantity output module 106, analog quantity recovery module 107, switch quantity input module 104 and CPU module 102 ...
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