Epitaxial growth method, epitaxial structure and photoelectric device
A technology of epitaxial growth and epitaxial structure, which is applied in the manufacture of electrical components, semiconductor devices, semiconductor/solid-state devices, etc., can solve problems such as hindering device performance, achieve the effects of improving crystal quality, suppressing interface fluctuations, and reducing twinning
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Embodiment 1
[0088] ginseng figure 2 As shown, the epitaxial growth method in this embodiment is to epitaxially grow a GaP thin film on a Si (100) substrate, which specifically includes the following steps:
[0089] 1. Treat the surface of the Si substrate.
[0090] 1.1. Clean the surface of the Si substrate.
[0091] First wash with acetone, isopropanol, and deionized water to remove organic matter on the substrate surface; then use NH 4 OH, H 2 o 2 , HCL, and deionized water for alkali cleaning and pickling; finally, HF and deionized water are used to remove surface oxides and organic matter; the cleaned Si substrate is cleaned with high-purity N 2 blow dry.
[0092] 1.2. Perform degassing pretreatment on the surface of the Si substrate.
[0093] The cleaned Si substrate is sent to the molecular beam epitaxy sample chamber for pre-degassing for 30 minutes; then sent to the pretreatment chamber for degassing at 300°C for 1.5 hours, and then sent to the growth chamber after degassin...
Embodiment 2
[0110] The epitaxial growth method in this embodiment is to epitaxially grow a GaP film on a Si(100) substrate, which specifically includes the following steps:
[0111] 1. Treat the surface of the Si substrate.
[0112] 1.1. Clean the surface of the Si substrate.
[0113] First wash with acetone, isopropanol, and deionized water to remove organic matter on the substrate surface; then use NH 4 OH, H 2 o 2 , HCL, and deionized water for alkali cleaning and pickling; finally, HF and deionized water are used to remove surface oxides and organic matter; the cleaned Si substrate is cleaned with high-purity N 2 blow dry.
[0114] 1.2. Perform degassing pretreatment on the surface of the Si substrate.
[0115] The cleaned Si substrate is sent to the molecular beam epitaxy sample chamber for pre-degassing for 30 minutes; then sent to the pretreatment chamber for degassing at 300°C for 1.5 hours, and then sent to the growth chamber after degassing is completed.
[0116] 1.3. Deoxid...
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