Radiation environment-oriented CPU anti-SEU effect reliability modeling and evaluation method

Abstract

The invention discloses a radiation environment-oriented CPU anti-SEU effect reliability modeling and evaluation method, which comprises the following steps of: performing hierarchical modeling on a CPU by adopting a Z language by taking different functional modules of the CPU as units, and establishing a reliability evaluation model FMRE-Z from bottom to top; further dividing different CPU function modules CFM, analyzing the real-time operation state and the state transition relation of each component of the CFM, performing Markov chain modeling, and calculating the reliability of the CFM; and based on the reliability probability of the CFM operation state, calculating the overall reliability of the CPU through the Bayesian network, and according to the established Bayesian network model, performing reverse reasoning, and recognizing a reliability key module. According to the method, modular abstraction is carried out on the CPU, the advantages of Z language modeling, the Markov chain and the Bayesian network are combined, and effective reliability analysis and evaluation can be carried out on the whole CPU and all CFMs.

Description

technical field [0001] The invention belongs to the field of reliability, formalized modeling and verification, in particular to a reliability modeling and evaluation method of CPU anti-SEU effect oriented to radiation environment. Background technique [0002] The continuous improvement of people's requirements for computer performance drives the continuous development of computer hardware technology, and the size of computer CPU transistors is getting smaller and smaller, which makes the CPU more susceptible to the influence of the external environment. CPU reliability analysis has become an urgent problem to be solved. [0003] CPU (Central Processing Unit) is the computing and control core of a computer system, and the final execution unit for information processing and program operation. CPU is mainly composed of cache memory (CACHE), prefetch unit (PFU, Prefetch Unit), memory protection unit (MPU, Memory Protection Unit), load storage unit (LSU, Load / Store Unit) and d...

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Problems solved by technology

[0008] The object of the present invention is to aim at the problem that single event effect easily occurs in CPU under the radiation environment, and provide a kind of reliability modeling and evaluation of CPU anti-SEU effect using Z language, continuous time Markov chain CTMC and Bayesian network BN method, which can describe CPU reliability in the form of seat constraints, so as to perform formal verification, and has good scalability

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