State-configurable in-situ aging sensor system

Abstract

The invention discloses a state-configurable in-situ aging sensor system which comprises a phase inverter, n buffer modules and a first counter. Each buffer module comprises a state configuration unit, a mode selector and a buffer which are connected in sequence, the mode selector in each buffer module is the external input end of the buffer module, and the buffer in each buffer module is the output end of the buffer module; the output end of the mth buffer module is connected with the external input end of the (m+1) th buffer module; the output end of the phase inverter is connected with the external input end of the first buffer module; and the output end of the last buffer module is respectively connected with the input end of the phase inverter and the input end of the first counter. The state configuration unit is adopted, so that the signal probability and the signal turnover rate of an intermediate node of a link can be configured, and the problem that in the prior art, aging prediction cannot be performed on a complex logic circuit due to the fact that the state of the intermediate node of a combinational logic link of a sensor is fixed is solved.

Description

technical field [0001] The invention relates to the field of integrated circuit aging prediction, in particular to an in-situ aging sensor system with configurable states. Background technique [0002] In integrated circuits, with the continuous reduction of transistor process dimensions, the reliability of the system has become increasingly prominent, and aging is one of the main factors affecting the reliability of integrated circuits. Many aging mechanisms, such as Negative Bias Temperature Instability (NBTI), Hot Carrier Injection (HCI), and Time-Dependent Dielectric Breakdown (TDDB), make the failure rate of integrated circuits increase rapidly over time during service life. High, it has a serious impact on the service life of the circuit, and even leads to the failure of the entire circuit system. Especially in the field of high reliability, such as space field, aircraft, motor vehicle and other systems, once the consequences of failure are unimaginable, these fields ...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above deficiencies in the prior art, the present invention provides a state-configurable in-situ aging sensor system that solves the problem that the prior art cannot predict the aging of complex logic circuits

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