Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Voltage sag event normalization method based on waveform characteristics

A technology of voltage sag and waveform characteristics, applied in the direction of measuring current/voltage, measuring electrical variables, computer components, etc., can solve problems such as poor identification accuracy of sag normalization, achieve improved method accuracy and strong practicability , high accuracy effect

Active Publication Date: 2020-12-22
SICHUAN UNIV
View PDF19 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problem of poor identification accuracy of traditional method sag normalization, and propose a voltage sag event normalization method based on waveform characteristics

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Voltage sag event normalization method based on waveform characteristics
  • Voltage sag event normalization method based on waveform characteristics
  • Voltage sag event normalization method based on waveform characteristics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0072] Before describing the specific embodiments of the present invention, in order to make the scheme of the present invention more clear and complete, at first the abbreviations and key term definitions that appear in the present invention are explained:

[0073] Normalization of voltage sag events: refers to the process of judging which recorded sag events are caused by the same fault according to the monitoring data because the power grid may record sag events at multiple monitoring points, which is called the normalization process;

[0074] Sag classification: According to the relationship between voltage sag three-phase voltage amplitude and phase, voltage sag events are conventionally divided into different sag types.

[0075] Such as figure 1 As shown, the present invention provides a voltage sag event normalization method based on waveform cha...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a voltage sag event normalization method based on waveform characteristics. The voltage sag event normalization method comprises the following steps of S1, acquiring A, B and Cthree-phase voltage amplitudes by utilizing a voltage monitoring device; S2, filtering zero-sequence voltage of A, B and C three-phase voltage amplitudes to obtain A, B and C three-phase voltage andA, B and C three-phase line voltage; S3, judging a sag type according to the A, B and C three-phase voltage and the A, B and C three-phase line voltage; S4, according to the A, B and C three-phase voltage amplitudes, calculating the segment similarity of events of the same sag type; S5, obtaining an initial similarity set according to the segment similarity of the events of the same sag type; andmining and correcting the influence of the transformer based on the association rule, outputting a normalization identification result, and completing normalization processing of the voltage sag event. According to the method, the influence of the monitoring device on the time error is overcome, the method does not completely depend on the criterion of the voltage sag occurrence moment, the sag waveform characteristics are considered, normalization identification is carried out by taking the sag waveform characteristics as the criterion, and the accuracy is high.

Description

technical field [0001] The invention belongs to the technical field of voltage sag events, and in particular relates to a voltage sag event normalization method based on waveform characteristics. Background technique [0002] Analyzing voltage sag monitoring data is the basis for understanding and managing voltage sag problems. Whether it is to trace the cause or location of the sag, or to evaluate the sag event, it is first necessary to perform normalized identification of the sag event, that is, to clarify the sag event recorded by a large number of power quality monitoring devices in the power grid , which events are caused by the same fault. If the normalization result of the slump event is wrong, it may affect the subsequent analysis results, such as overestimation or underestimation of the sag evaluation result. However, the traditional method usually identifies the occurrence time of the sag event recorded by the monitoring device, and considers that the sag event o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/62G06K9/00G01R19/165
CPCG01R19/16576G01R19/16538G06F2218/08G06F2218/12G06F18/22
Inventor 胡文曦肖先勇汪颖郑子萱李长松
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com