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A kind of unsealing method of molded solid tantalum capacitor

A tantalum capacitor, solid technology, applied in the field of molded solid tantalum capacitor unsealing, can solve the problem that the integrity of the dielectric layer cannot be guaranteed, and achieve the effect of meeting the inspection requirements

Active Publication Date: 2022-07-08
BEIJING ZHENXING METROLOGY & TEST INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention provides a molded solid tantalum capacitor unsealing method, which combines wet etching method and mechanical method, solves the problem that the current mechanical unsealing method or single chemical reagent wet etching method cannot guarantee the integrity of the dielectric layer after unsealing sexual technical issues

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  • A kind of unsealing method of molded solid tantalum capacitor

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Embodiment Construction

[0024] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the preferred embodiments of the present invention are described in detail below, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to understand the present invention. The scope of protection should be more clearly defined. For those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative effort.

[0025] The invention provides a method for unsealing a molded solid tantalum capacitor. The molded solid tantalum capacitor to be unsealed comprises a tantalum core and an encapsulating material layer for encapsulating the tantalum core; , a dielectric layer and an anode body; the unsealing method includes the following steps:

[0026] The encapsulating material layer of the molded solid tantalum capacitor is removed with a corrosive...

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Abstract

The invention discloses a method for unsealing a molded solid tantalum capacitor. The molded solid tantalum capacitor to be unsealed comprises a tantalum core and an encapsulation material layer for encapsulating the tantalum core; Sealing material layer to expose the internal tantalum core; remove the conductive connection layer and the cathode layer with a reagent that can catalyze the reaction with the cathode layer to expose the dielectric layer; use organic solvent to clean the dielectric layer; use the inlay liquid along the section direction of the tantalum core Mount the tantalum core with the exposed dielectric layer; grind the mounted tantalum core until the anode body, the dielectric layer, and the interface layer between the anode body and the dielectric layer to be observed are exposed. The beneficial effects of the present invention are that the molded solid tantalum capacitor can be unsealed by a combination of wet etching and mechanical methods, so as to ensure that the internal dielectric layer and anode body of the tantalum capacitor can be completely observed after unsealing, so as to meet the inspection requirements of failure analysis.

Description

technical field [0001] The invention relates to the field of failure analysis of tantalum capacitors, in particular to a method for unsealing a molded solid tantalum capacitor. Background technique [0002] Molded solid tantalum capacitors are made by sintering tantalum powder at high temperature to form an anode tantalum block with a porous structure, forming a tantalum pentoxide dielectric layer on the surface of tantalum, depositing manganese dioxide outside the dielectric layer as a cathode, and covering the outermost layer with a ring Made of oxygen resin, it has the advantages of large capacity, light weight, low equivalent resistance and self-healing. In order to test the quality of the dielectric film process of the molded solid tantalum capacitor and find out the cause of the failure, the solid tantalum capacitor must be unsealed. At this stage, the mechanical unpacking method or the wet etching method of a single chemical agent is generally used, which cannot guar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28G01N1/32G01N1/34G01N1/36G01N23/2202
CPCG01N1/32G01N1/34G01N1/36G01N1/286G01N23/2202G01N2001/2866
Inventor 李智王志林
Owner BEIJING ZHENXING METROLOGY & TEST INST
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