Mutual inductor handover test device and test method thereof

Abstract

The invention discloses a mutual inductor handover test device and a test method thereof. The device comprises a test wire clamp, a switching device and a tester. The test wire clamp is connected to the input end of the switching device through a test wire. A test port of the switching device is connected to the tester, the test wire clamp can clamp a screw of a secondary side terminal of the mutual inductor, the switching device is used for connecting and short-circuiting a secondary winding of the mutual inductor, and the tester comprises an insulation resistance tester, a transformation ratio tester, a mutual inductor characteristic tester and a direct-current resistance tester. According to the invention, through using the test wire clamp, the switching device and different testers, the test wire clamp is connected with the switching device, the switching device is connected to the secondary winding of the mutual inductor at a time, various tests are achieved when the mutual inductor is handed over, the functions of open circuit, short circuit and grounding operation of the secondary side winding are rapidly completed only through switching of the switching device, the test time is shortened, and the test efficiency is improved.

Description

technical field [0001] The invention relates to a transformer handover test device and a test method thereof, and belongs to the technical field of transformer handover test equipment. Background technique [0002] At present, when we are testing the transformer, the test items are as follows: [0003] insulation test Characteristic test 1. Primary to secondary insulation resistance 4. Ratio 2. Primary to secondary AC withstand voltage 5. Excitation characteristics, polarity calibration, secondary winding direct resistance 3. Insulation resistance to ground between secondary windings [0004] During the test, there were two problems: [0005] First aspect: For the above test items, the position of the test line that needs to be connected to the secondary terminal is different, and the state of the short circuit of the outgoing terminal of the secondary winding is also different. It is necessary for the tester to frequently change the test...

AI Technical Summary

Problems solved by technology

[0014] The second aspect: when performing test wiring and short-circuiting on the secondary terminals of the transformer, it is also a time-consuming and laborious problem to reliably connect the test line and short-circuit the secondary terminals of the transformer

Due to the certain elasticity of bare wires, coupled with the limited area of ​​each secondary terminal nut, and the smooth surface of the nut, multiple strands of bare wires are easy to slip off from the nut

When using the nut tightening method, it is necessary to loosen all the nuts, then wind them with bare wires, and then tighten the nuts. Because the wires are soft, it is easy to cause poor contact due to loose crimping, and it is time-consuming and laborious.

[0016] (2) The traditional test wire clamp is also used to short-circuit the secondary terminal in the test, but due to the limited area of ​​the terminal nut and the smooth surface of the nut, the traditional test wire clamp is also easy to slip off from the nut

[0017] (3) In order to make the short connection more firm, sometimes we remove all the secondary terminal bolts of the transformer, insert the test wire clamp into the secondary terminal hole and clamp it. Although this method is more reliable than the above method, it is expensive The time is too long, the removed nut gasket is easy to lose

[0018] When using bare wires and test wire clips to short-circuit the secondary terminals, not only the operation is very inconvenient

It is easy to slip and then leak and short circuit, which will lead to the termination of the test, affect the test data, prolong the test time, and cause the secondary side to discharge during the withstand voltage test, resulting in equipment damage

[0019] Summarize the above three problems: slipping, missing and shorting, time-consuming and labor-intensive

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